ASTM E1217
Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
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About This Item
ASTM E1217 is a technical standard that addresses how to determine the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers. It helps define the effective area being analyzed, which is important for interpreting surface analysis results with greater consistency. By clarifying how the signal is linked to the specimen, this ASTM standard supports more reliable measurements, comparison of data, and informed quality control decisions in analytical workflows.
Purpose of ASTM E1217
The purpose of ASTM E1217 is to provide a practice for determining the portion of a specimen that contributes to the signal detected during Auger electron spectroscopy and, in some cases, X-ray photoelectron spectroscopy. This matters because the measured area can affect how surface information is interpreted and reported. The standard is useful when analysts need a consistent way to relate instrument response to the specimen surface, especially in work where measurement precision and repeatability are important.
Common use cases of ASTM E1217
This standard is commonly used in surface analysis laboratories and materials characterization workflows where Auger electron spectrometers or certain X-ray photoelectron spectrometers are used. It is relevant when users need to understand the effective specimen area behind a detected signal, such as during method setup, instrument evaluation, or data interpretation. ASTM E1217 is also helpful when comparing results across tests or instruments and when supporting documentation for analytical procedures is required.
Why ASTM E1217 matters
ASTM E1217 matters because the specimen area contributing to a signal can directly influence how surface analysis results are understood and trusted. A clear practice for determining that area supports consistency in testing, reduces ambiguity in reporting, and helps users make better comparisons between measurements. For organizations that rely on spectroscopic surface analysis, this ASTM standard can be an important reference for quality control, procurement decisions, and technical compliance.
- Effective specimen area determination
- Auger electron spectroscopy workflows
- Selected X-ray photoelectron spectroscopy applications
- Signal interpretation and data consistency
- Surface analysis quality control
- Publication Date: 2019-11-15
- Publisher: ASTM
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