ASTM E2735
Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Available Formats:
- Availability: Immediate Download
- Language: English
- License Type: Single User
- Updates: Not Included
- Availability: Request Quote
- Language: English
- License Type: Enterprise / Multi User
- Updates: Included
About This Item
ASTM E2735 is a guide for selecting the calibrations needed for X-ray Photoelectron Spectroscopy (XPS) experiments. It helps users identify the calibration steps that support reliable measurement setup, instrument performance, and data quality in XPS work. By clarifying what should be calibrated and when, the standard supports more consistent results and better technical confidence in surface analysis. For laboratories and users who rely on XPS, this standard can help improve measurement readiness and reduce uncertainty.
Overview of ASTM E2735
The official title of ASTM E2735 shows that it is a selection guide, not a test method or acceptance specification. Its purpose is to help users determine which calibrations are needed for XPS experiments based on the measurement task and instrument context. This is important because XPS results depend on accurate instrument setup and calibration choices. ASTM E2735 supports a more structured approach to preparing XPS measurements and documenting calibration needs in a practical, standards-based way.
Common use cases of ASTM E2735
This standard is commonly used when planning or reviewing XPS measurements in laboratories that perform surface and thin-film analysis. It is useful for selecting calibrations before routine testing, method setup, instrument verification, or quality-focused measurement work. ASTM E2735 may also support procurement and internal procedure development when a team needs clear guidance on calibration expectations for XPS systems. It is especially relevant where measurement consistency and traceability matter.
Benefits of using ASTM E2735
Using ASTM E2735 can improve consistency in XPS experiment preparation by helping users select appropriate calibrations rather than relying on ad hoc decisions. That can support better compliance with internal procedures, more dependable data comparison, and lower risk of measurement error. It is also helpful for quality control, technical review, and documentation of instrument readiness. For organizations that use XPS regularly, the standard can streamline workflow decisions and strengthen confidence in results.
- Calibration selection guidance for XPS work
- Supports measurement consistency
- Useful for planning and review
- Helps document instrument setup needs
- Aligned with surface analysis workflows
- Publication Date: 2023-09-13
- Publisher: ASTM
Need This Standard?
Request a personalized quote today to receive the latest edition in PDF or other available formats.
Need This Standard?
Request a personalized quote today to receive the latest edition in PDF or other available formats.
Summarize with AI
Get quick summaries using your favorite AI engine.
Online Standart Disclaimer
OnlineStandart.com is an authorized reseller of international standards through partnerships with authorized distributors. We do not own the copyrights or trademarks of the standards we sell, including but not limited to those of API, ASHRAE, BSI, SAE, ASTM, IEEE, IEC, ASME, ISO, and others.
All product names, logos, and brands are property of their respective owners. All company, product, and service names used on this website are for identification purposes only. Use of these names, trademarks, and brands does not imply endorsement.
The content provided on this website is for informational purposes only and is intended to promote our reselling services. OnlineStandart.com is not affiliated with or endorsed by any of the standard organizations unless explicitly stated.