IEC 60191-2Y:2000
Twenty-third supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
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Language: English
License Type: Single User
Updates: Not Included
About This Item
IEC 60191-2Y:2000 defines a mechanical standardization reference for semiconductor devices, with a focus on dimensions under the Twenty-third supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions. For engineering teams, procurement specialists, and compliance reviewers, IEC 60191-2Y:2000 helps support consistent package interpretation, dimensional comparison, and documentation review when assessing device suitability. It is most relevant where mechanical compatibility, drawing alignment, and product evaluation need to be checked against a recognized technical reference.
Overview of IEC 60191-2Y:2000
This document serves as a dimensional reference within the broader semiconductor device standardization framework. IEC 60191-2Y:2000 is intended to support technical review of package geometry and related mechanical characteristics, which may be important during design verification, supplier qualification, and conformity assessment. By providing a structured basis for dimensions, it helps organizations maintain operational consistency across engineering documentation, drawing control, and product comparison activities involving semiconductor components.
Compliance applications of IEC 60191-2Y:2000
In practical workflows, IEC 60191-2Y:2000 may be used during part selection, incoming inspection, laboratory evaluation, and drawing validation for semiconductor devices. It can assist teams that need to compare package dimensions across suppliers or confirm compatibility with assembly, mounting, or test fixtures. The reference is also useful for technical assessment and regulatory preparation where dimensional conformity forms part of the documented evaluation process for electronic components and associated hardware.
Importance of compliance with IEC 60191-2Y:2000
Using IEC 60191-2Y:2000 as a compliance reference can reduce dimensional mismatches that affect assembly yield, interchangeability, and verification activities. It supports more consistent engineering validation and strengthens procurement review by giving stakeholders a common basis for interpreting semiconductor device dimensions. For organizations managing quality workflows or conformity assessment preparation, the document helps improve technical consistency, lower integration risk, and provide clearer evidence during compliance and acceptance checks.
- Mechanical standardization guidance for semiconductor device dimensions
- Useful for package comparison, drawing review, and device identification workflows
- Supports verification activities in engineering, inspection, and supplier qualification
- Helps align dimensional expectations during procurement and conformity assessment
- Publication Date: 2000-06-16
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- This Version: IEC 60191-2Y:2000 (2000-06-16)
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