IEC 60191-6-16:2007
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
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Language: English
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About This Item
IEC 60191-6-16:2007 provides a technical glossary for semiconductor tests and burn-in sockets used with BGA, LGA, FBGA and FLGA package types. For engineering teams, test labs, and procurement groups, it offers a clear reference point when reviewing package-related terminology and documenting test setups. IEC 60191-6-16:2007 is especially useful where consistent language is needed across technical evaluation, conformity assessment, and quality workflows involving semiconductor device verification and socket selection.
IEC 60191-6-16:2007 standard overview
IEC 60191-6-16:2007 is part of the mechanical standardization of semiconductor devices series and focuses on glossary terms for semiconductor tests and burn-in sockets. Its likely purpose is to improve operational consistency by defining how these terms are used in engineering documentation, technical review, and supplier communication. By standardizing terminology around BGA, LGA, FBGA, and FLGA-related test interfaces, it supports clearer specification interpretation and more reliable comparison of test and handling requirements across organizations.
Applications of IEC 60191-6-16:2007
This document is relevant in semiconductor packaging and test environments where burn-in sockets and device test fixtures are specified, reviewed, or purchased. It may support laboratory evaluation, product evaluation, and technical validation activities for memory devices, processors, and other integrated circuits that use the referenced package families. It is also useful in engineering documentation and procurement workflows when teams need a common glossary for interpreting socket-related requirements during testing, verification activities, and compliance preparation.
Why IEC 60191-6-16:2007 matters
Clear terminology reduces the risk of miscommunication in semiconductor test planning, especially when burn-in sockets and package interfaces affect measurement repeatability and handling consistency. IEC 60191-6-16:2007 helps teams align technical language before design qualification, supplier review, or conformity assessment work. That can improve testing consistency, support quality assurance, and reduce delays caused by ambiguous documentation. For organizations managing verification activities or regulatory preparation, a defined glossary can be a practical control for accuracy and traceability.
- Glossary terms for semiconductor tests and burn-in sockets
- Coverage aligned with BGA, LGA, FBGA, and FLGA package families
- Useful for technical documentation, supplier communication, and lab review
- Supports consistent terminology in testing workflows and compliance workflows
- Helpful for procurement checks, engineering validation, and conformity assessment preparation
- Publication Date: 2007-04-26
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- This Version: IEC 60191-6-16:2007 (2007-04-26)
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