IEC 60191-6-20:2010
Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ)
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Language: English
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About This Item
IEC 60191-6-20:2010 defines measuring methods for package dimensions of small outline J-lead packages (SOJ) within the broader Mechanical standardization of semiconductor devices framework. It is relevant when engineering teams, suppliers, and laboratories need a consistent technical basis for outline drawings, dimensional verification, and procurement review. By aligning measurement practice for surface mounted semiconductor device packages, IEC 60191-6-20:2010 supports documented evaluation, operational consistency, and clearer conformity assessment during product development and acceptance workflows.
Overview of IEC 60191-6-20:2010
This document focuses on the preparation of outline drawings and the measurement approach used for SOJ package dimensions. In practice, it helps define how package geometry is represented and assessed so that technical documentation can be compared consistently across design, manufacturing, and verification activities. IEC 60191-6-20:2010 is most useful where dimensional data must be reviewed for engineering specification control, supplier qualification, and technical validation of semiconductor package formats used in surface mounting applications.
Compliance applications of IEC 60191-6-20:2010
Organizations may use IEC 60191-6-20:2010 in product evaluation, incoming inspection, drawing review, and laboratory evaluation of semiconductor components with SOJ package styles. It can support testing workflows where dimensional measurements must be recorded in a repeatable way, especially during design transfer, procurement checks, or quality workflows that depend on accurate package definitions. The reference is also helpful when preparing engineering documentation for conformity assessment and when comparing supplier data against a common dimensional basis.
Importance of compliance with IEC 60191-6-20:2010
Consistent use of IEC 60191-6-20:2010 helps reduce ambiguity in package dimension reporting, which can improve interoperability between design, manufacturing, and test teams. Clear measurement rules support risk management by lowering the chance of misinterpretation in procurement or validation, especially where exact package geometry affects assembly fit or inspection decisions. For organizations managing technical compliance, the document can strengthen quality assurance, improve traceability in regulatory preparation, and provide a more reliable reference for technical review.
- Measuring methods for SOJ package dimensions
- Preparation and interpretation of outline drawings
- Support for dimensional verification and supplier comparison
- Useful reference for compliance workflows and technical documentation
- Publication Date: 2010-08-30
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- This Version: IEC 60191-6-20:2010 (2010-08-30)
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