IEC 60444-9:2007 PDF | Request Standard
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IEC 60444-9:2007

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

Standard by IEC, 2007-02-20

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  • Availability: Immediate Download
  • Language: English
  • License Type: Single User
  • Updates: Not Included
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  • Language: English
  • License Type: Enterprise / Multi User
  • Updates: Included

About This Item

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IEC 60444-9:2007 is the technical reference for measuring spurious resonances of piezoelectric crystal units, helping engineers and laboratories assess parasitic responses that can affect device performance. In quartz crystal-based designs, these unwanted resonances may influence frequency stability, filter behavior, and overall signal integrity. By providing a structured measurement approach, IEC 60444-9:2007 supports documented evaluation, technical review, and product evaluation during development, qualification, and procurement decisions for frequency-control components.

Purpose of IEC 60444-9:2007

The purpose of IEC 60444-9:2007 is to define a repeatable method for measuring spurious resonances in piezoelectric crystal units within the broader framework of quartz crystal parameter testing. Such measurements are important when engineering teams need to understand how a device behaves beyond its main resonance. The document is relevant to technical validation, laboratory evaluation, and conformity assessment activities where consistent test interpretation and controlled measurement practices are needed.

Compliance applications of IEC 60444-9:2007

IEC 60444-9:2007 is typically used in testing workflows for crystal units intended for oscillators, timing circuits, and other frequency-sensitive electronic equipment. It can support supplier qualification, incoming inspection, and product release reviews where spurious resonance performance may affect specification compliance. The reference is also useful in quality workflows that require documented test methods for engineering documentation, technical assessment, and procurement review of quartz components.

Benefits of IEC 60444-9:2007

Using IEC 60444-9:2007 can improve testing consistency and reduce ambiguity when evaluating parasitic resonances in piezoelectric crystal units. That helps organizations compare results across laboratories, strengthen conformity assessment preparation, and support risk management in design verification. It is also valuable for procurement and compliance teams that need a clear technical document to confirm that measurement practices align with expected performance criteria and operational consistency requirements.

  • Measurement guidance for spurious resonances in piezoelectric crystal units
  • Supports repeatable laboratory evaluation and verification activities
  • Useful for timing, oscillator, and frequency-control component assessment
  • Helps document technical compliance and supplier review decisions
  • Assists quality assurance teams with consistent test interpretation
SKU: 010c04d6725a

  • Publication Date: 2007-02-20
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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