IEC 60682:1980/AMD1:1987 PDF | Request Standard
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IEC 60682:1980/AMD1:1987

Amendment 1 - Standard method of measuring the pinch temperature of quartz-tungsten-halogen lamps

Standard by IEC, 1987-01-01

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  • Language: English
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About This Item

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IEC 60682:1980/AMD1:1987 provides Amendment 1 to the standard method of measuring the pinch temperature of quartz-tungsten-halogen lamps, making it relevant for organizations that need a consistent technical reference for lamp evaluation and compliance documentation. For teams managing product testing, technical review, or procurement decisions, IEC 60682:1980/AMD1:1987 helps clarify how a key thermal measurement should be approached so results can be compared more reliably across laboratories and quality workflows. It supports controlled verification activities and documented evaluation of lamp performance.

Overview of IEC 60682:1980/AMD1:1987

As an amendment linked to IEC 60682:1980, this document is a supporting reference rather than a standalone primary requirement. Its focus is the standard method of measuring pinch temperature in quartz-tungsten-halogen lamps, which is a relevant parameter in technical assessment and product validation. For engineering teams, the amendment may be used to align test practice, review measurement consistency, and maintain a traceable compliance reference during qualification or conformity assessment work.

Compliance applications of IEC 60682:1980/AMD1:1987

This technical document is most useful in lamp testing workflows, laboratory evaluation, and specification review for quartz-tungsten-halogen lighting products. It can support manufacturers, test houses, and procurement teams that need a documented basis for comparing measurement results or checking whether internal procedures match the parent reference. IEC 60682:1980/AMD1:1987 may also be consulted during regulatory preparation, product evaluation, and quality assurance activities where controlled thermal measurement is part of the acceptance process.

Importance of compliance with IEC 60682:1980/AMD1:1987

Using the amendment alongside the parent document helps improve testing consistency and reduces ambiguity in engineering documentation. That matters when pinch temperature results are used to support technical validation, safety review, or conformity assessment preparation. A stable measurement method can also lower risk in procurement and supplier qualification by making performance claims easier to verify. For organizations working with quartz-tungsten-halogen lamps, IEC 60682:1980/AMD1:1987 can strengthen operational consistency and support more dependable compliance workflows.

  • Supporting amendment to IEC 60682:1980 for pinch temperature measurement methodology
  • Relevant to laboratory testing, product evaluation, and documented verification activities
  • Useful for conformity assessment preparation and quality control procedures
  • Helps align measurement practice across engineering and compliance workflows
SKU: 7b117681d2a8

  • Publication Date: 1987-01-01
  • Standard Status: Amendment
  • Publisher: IEC
  • Edition: 1

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