IEC 60747-14-5:2010 PDF | Request Standard
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IEC 60747-14-5:2010

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

Standard by IEC, 2010-11-02

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About This Item

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IEC 60747-14-5:2010 defines the technical reference for semiconductor devices used as PN-junction semiconductor temperature sensors. For engineering teams, test laboratories, and procurement specialists, it supports documented evaluation of a device category where temperature sensing behavior must be understood in a controlled and comparable way. IEC 60747-14-5:2010 is relevant when reviewing component suitability, preparing technical documentation, or aligning verification activities with a recognized compliance reference for semiconductor sensor selection and assessment.

What is IEC 60747-14-5:2010?

This document is part of the semiconductor devices series and focuses specifically on PN-junction semiconductor temperature sensors. It is used as a technical document for defining the product family, helping users interpret device requirements in an engineering specification or conformity assessment workflow. For organizations carrying out technical review, laboratory evaluation, or quality workflows, the title indicates a narrow and practical scope centered on temperature sensing behavior in semiconductor form rather than broader sensor systems.

Applications of IEC 60747-14-5:2010

The reference is typically relevant to component engineers, test houses, and buyers working with temperature-sensing semiconductor parts in electronic equipment and control systems. It may support product evaluation, incoming inspection, and supplier documentation review where PN-junction sensors are part of a monitored design. In technical assessment and regulatory preparation, the document can also help create consistent testing workflows and improve operational consistency when comparing parts across projects, prototypes, or procurement batches.

Why is IEC 60747-14-5:2010 important?

Using a defined reference for PN-junction semiconductor temperature sensors helps reduce ambiguity in engineering validation and conformity assessment preparation. It supports consistent test planning, clearer procurement decisions, and more reliable technical compliance discussions between design, quality, and laboratory teams. For organizations managing safety, performance criteria, or risk management activities, the document provides a focused basis for documenting expectations and checking that sensor-related evaluations are aligned with a recognized technical framework.

  • Focused on PN-junction semiconductor temperature sensor requirements and related evaluation needs
  • Useful for laboratory testing, technical review, and documented product assessment
  • Supports procurement checks and engineering documentation for sensor selection
  • Helps align verification activities with compliance and quality assurance workflows
SKU: 4b0e23c9263f

  • Publication Date: 2010-11-02
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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