IEC 60747-19-1:2019
Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
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About This Item
IEC 60747-19-1:2019 is the technical reference for Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors, providing a focused basis for evaluating how smart sensor control functions are defined and organized. For engineering teams, test laboratories, and procurement specialists, IEC 60747-19-1:2019 can support technical review, documented evaluation, and conformity assessment preparation where control architecture and device behavior need to be understood consistently. As an original 2019 edition, it serves as the primary reference for this part of the semiconductor device series.
What is IEC 60747-19-1:2019?
This document addresses the control scheme of smart sensors within the semiconductor devices series, with emphasis on how the relevant control approach is structured for technical use and assessment. It is generally relevant when teams need a compliance reference for design verification, product evaluation, or quality workflows tied to sensor control behavior. By defining the subject at the device and control-scheme level, IEC 60747-19-1:2019 helps align engineering documentation, testing workflows, and technical validation activities around a common reference point.
Applications of IEC 60747-19-1:2019
IEC 60747-19-1:2019 is typically used in smart sensor design review, semiconductor documentation, laboratory evaluation, and procurement checks where the control scheme must be understood before integration or acceptance. It may also support internal risk management and regulatory preparation for organizations comparing sensor components across suppliers or validating them against project requirements. In practice, the document is useful for teams involved in engineering specification review, product evaluation, and conformity assessment planning for sensor-based electronic systems.
Why is IEC 60747-19-1:2019 important?
Clear control-scheme guidance can reduce ambiguity in technical assessment and improve consistency across testing and verification activities. For organizations working with smart sensors, IEC 60747-19-1:2019 helps support safer design decisions, more reliable interoperability checks, and more defensible compliance workflows. It is also valuable during procurement and supplier comparison, where a structured technical document can help confirm that the device definition, evaluation approach, and documentation set are aligned before approval or deployment.
- Focuses on the control scheme associated with smart sensors in semiconductor devices
- Supports engineering documentation, technical review, and verification activities
- Useful for laboratory evaluation, product evaluation, and conformity assessment preparation
- Helps teams standardize compliance workflows and reduce interpretation gaps
- Provides a practical reference for procurement and supplier technical assessment
- Publication Date: 2019-11-22
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- This Version: IEC 60747-19-1:2019 (2019-11-22)
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