IEC 60747-4:2007 PDF | Request Standard
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IEC 60747-4:2007

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

Standard by IEC, 2007-08-23

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  • Language: English
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  • Updates: Not Included
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  • Language: English
  • License Type: Enterprise / Multi User
  • Updates: Included

About This Item

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IEC 60747-4:2007 provides the primary technical reference for semiconductor devices focused on discrete microwave diodes and transistors. It is relevant when teams need a structured basis for product evaluation, specification review, and conformity assessment of high-frequency components used in electronic designs. For engineering, procurement, and laboratory workflows, IEC 60747-4:2007 helps align technical documentation with a recognized framework for assessing device characteristics and supporting consistent verification activities.

IEC 60747-4:2007 standard overview

As part of the IEC 60747 series, IEC 60747-4:2007 addresses discrete semiconductor devices with an emphasis on microwave diodes and transistors. Its role is generally to define the technical reference point used in design documentation, test planning, and quality workflows involving these components. Organizations may use it to support technical review, documented evaluation, and procurement comparisons where performance, operating limits, and compliance evidence for discrete microwave devices must be considered.

Applications of IEC 60747-4:2007

This document is commonly relevant in product development, component sourcing, and laboratory evaluation for microwave-frequency electronics. It may be used by manufacturers, test houses, and compliance teams working with discrete diodes and transistors in RF or microwave-related equipment, where technical validation and operational consistency are important. It can also support engineering documentation and regulatory preparation when organizations need a clear reference for assessing component suitability in high-frequency circuits and associated testing workflows.

Why IEC 60747-4:2007 matters

IEC 60747-4:2007 matters because it helps reduce ambiguity when evaluating discrete microwave semiconductor devices for technical compliance and product approval. A shared reference can improve testing consistency, support risk management, and make conformity assessment preparation more efficient. For procurement and engineering teams, it provides a dependable basis for comparing supplier documentation, checking device characteristics, and maintaining quality assurance across design and verification activities. That makes it useful wherever reliable technical assessment is needed before release or integration.

  • Technical reference for discrete microwave diodes and transistors
  • Supports product evaluation, specification review, and engineering documentation
  • Useful for laboratory testing, verification activities, and conformity assessment
  • Helps procurement and compliance teams compare component data consistently
  • Assists with quality assurance and technical validation in RF and microwave workflows
SKU: 5d708c1023b1

  • Publication Date: 2007-08-23
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 2

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