IEC 60749-11:2002/COR1:2003 PDF | Request Standard
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IEC 60749-11:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Standard by IEC, 2003-01-30

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About This Item

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IEC 60749-11:2002/COR1:2003 is a corrigendum connected to the parent document IEC 60749-11:2002, addressing the section on semiconductor devices and mechanical and climatic test methods for rapid change of temperature using the two-fluid-bath method. For engineering teams, laboratories, and procurement specialists, it is relevant because corrigenda help ensure that the referenced technical document reflects the intended wording and can be used with greater confidence in testing workflows, documented evaluation, and conformity assessment activities.

Purpose of IEC 60749-11:2002/COR1:2003

The purpose of IEC 60749-11:2002/COR1:2003 is to correct or clarify the parent testing guidance for rapid temperature change conditions applied to semiconductor devices. As a supporting document rather than a standalone test method, it helps preserve the technical accuracy of the original specification and supports consistent interpretation during laboratory evaluation, technical review, and quality workflows. In practice, this kind of corrigendum is useful when organizations need a reliable compliance reference for verification activities and engineering documentation.

Compliance applications of IEC 60749-11:2002/COR1:2003

IEC 60749-11:2002/COR1:2003 is typically consulted alongside the parent document when organizations perform environmental stress testing on semiconductor components. It may be used in test planning, supplier qualification, and audit preparation where temperature cycling or rapid change of temperature is part of the product evaluation process. For compliance teams, the corrigendum helps maintain technical consistency across test reports, procurement specifications, and conformity assessment records, especially when the two-fluid-bath method is referenced in formal documentation.

Benefits of IEC 60749-11:2002/COR1:2003

Using IEC 60749-11:2002/COR1:2003 supports risk reduction by helping ensure that testing and reporting align with the corrected published text. That can improve engineering validation, reduce ambiguity in laboratory procedures, and strengthen technical compliance during product acceptance or supplier review. It is also valuable for organizations that manage controlled documentation, because even a corrigendum can affect the interpretation of a test method and the consistency of results used in procurement or regulatory preparation workflows.

  • Supports corrected interpretation of the rapid change of temperature two-fluid-bath test method
  • Helps align laboratory procedures with the parent document IEC 60749-11:2002
  • Useful for semiconductor qualification, supplier review, and test report verification
  • Assists compliance teams in maintaining accurate engineering documentation and audit records
SKU: 06c74c589cb1

  • Publication Date: 2003-01-30
  • Standard Status: Corrigendum
  • Publisher: IEC
  • Edition: 1

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