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IEC 60749-7:2011

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Standard by IEC, 2011-06-17

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  • Language: English
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About This Item

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IEC 60749-7:2011 defines a technical basis for measuring internal moisture content and analyzing other residual gases in semiconductor devices. As part of the Mechanical and climatic test methods series, it supports evaluation of conditions that can affect device reliability, package integrity, and long-term performance. For engineering teams, laboratories, and procurement reviewers, IEC 60749-7:2011 is a relevant reference when moisture-related risks, contamination assessment, or documented test results are part of the technical review or compliance workflow.

IEC 60749-7:2011 standard overview

This document focuses on methods used to assess residual moisture and other trapped gases within semiconductor devices, helping organizations build a more consistent technical assessment process. It is particularly relevant where verification activities need to support product qualification, laboratory evaluation, or failure analysis. In practice, the title indicates a measurement-oriented testing standard within semiconductor device reliability work, making it useful for teams that need traceable evidence for conformity assessment, quality workflows, or engineering documentation.

Applications of IEC 60749-7:2011

IEC 60749-7:2011 is commonly used in semiconductor manufacturing, device qualification, reliability testing, and analytical laboratory work where internal contamination or residual gas content may influence outcomes. It may support product evaluation before release, supplier documentation checks, or technical validation during design and process review. Organizations involved in moisture sensitivity control, package assessment, or root-cause investigation may use it to align testing workflows and improve operational consistency across engineering and compliance activities.

Why IEC 60749-7:2011 matters

For organizations handling semiconductor devices, the ability to measure internal moisture content and analyze residual gases can reduce technical risk and support better decision-making. The document helps improve testing consistency, which is important when results are used for compliance preparation, procurement review, or conformity assessment. It also supports quality assurance by giving teams a defined reference for documented evaluation, helping reduce ambiguity in laboratory results and strengthening confidence in engineering validation and product acceptance decisions.

  • Measurement-oriented guidance for internal moisture content in semiconductor devices
  • Support for residual gas analysis as part of reliability and contamination review
  • Useful for laboratory evaluation, qualification testing, and technical validation
  • Helps align quality workflows and documented assessment practices
  • Relevant when procurement or compliance teams need traceable technical reference material
SKU: 32607671fc06

  • Publication Date: 2011-06-17
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 2

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