IEC 60749-8:2002/COR1:2003 PDF | Request Standard
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IEC 60749-8:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Standard by IEC, 2003-04-23

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About This Item

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IEC 60749-8:2002/COR1:2003 is a corrigendum linked to the semiconductor device mechanical and climatic test method for sealing, helping users apply the corrected technical reference with greater confidence. For engineering, laboratory, and procurement teams, IEC 60749-8:2002/COR1:2003 supports accurate document control when reviewing test methods for package sealing performance and related qualification activities. As a supporting publication to IEC 60749-8:2002, it is relevant where technical review, conformity assessment, and controlled compliance workflows depend on the corrected wording.

What is IEC 60749-8:2002/COR1:2003?

This corrigendum modifies IEC 60749-8:2002, which addresses sealing within the broader series of semiconductor devices mechanical and climatic test methods. In practical terms, it is used as a corrective reference rather than a standalone test method, so teams can align documentation, laboratory evaluation, and verification activities with the intended text. Organizations working with semiconductor qualification, technical validation, or quality workflows may consult IEC 60749-8:2002/COR1:2003 to maintain consistency in interpretation and test documentation.

Applications of IEC 60749-8:2002/COR1:2003

Typical use cases include semiconductor device qualification files, internal test procedures, supplier review packages, and compliance preparation for sealed packages or assemblies where climatic and mechanical conditions are part of the assessment. IEC 60749-8:2002/COR1:2003 may be referenced during technical assessment of component reliability, product evaluation, or laboratory evaluation when sealing performance is being documented against an established method. It is also useful in controlled engineering documentation where the parent test method must be cited accurately.

Why is IEC 60749-8:2002/COR1:2003 important?

Corrective documents like IEC 60749-8:2002/COR1:2003 matter because even a small textual correction can affect repeatability, interpretation, and conformity assessment preparation. In sealing-related testing, consistent wording helps reduce ambiguity in procedures, supports risk management, and improves operational consistency across labs, suppliers, and audit reviews. For procurement and compliance teams, using the corrected reference supports cleaner technical review, more reliable verification activities, and better alignment between engineering documentation and the governing test method.

  • Corrigendum to IEC 60749-8:2002 for sealing-related test method text correction
  • Useful for controlled documentation, laboratory procedures, and supplier-facing compliance references
  • Supports qualification, verification, and technical review activities in semiconductor workflows
  • Helps maintain consistency in conformity assessment and quality assurance records
SKU: 53c712225e43

  • Publication Date: 2003-04-23
  • Standard Status: Corrigendum
  • Publisher: IEC
  • Edition: 1

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