IEC 61000-4-17:1999/AMD1:2001
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test
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About This Item
IEC 61000-4-17:1999/AMD1:2001 is an amendment to the EMC testing reference for ripple on a d.c. input power port immunity test, making it relevant when assessing how electrical equipment responds to disturbances on direct-current supply inputs. For engineering teams, laboratories, and compliance groups, it supports more consistent technical review and documented evaluation of immunity requirements. As a supporting document to IEC 61000-4-17:1999, it should be used alongside the parent text when preparing verification activities, test plans, or conformity assessment records.
Overview of IEC 61000-4-17:1999/AMD1:2001
This document modifies the original EMC testing and measurement technique for ripple on a d.c. input power port immunity testing. In practical terms, IEC 61000-4-17:1999/AMD1:2001 is most useful where engineers need to confirm whether equipment connected to a d.c. supply can maintain operational consistency under ripple conditions. It is commonly reviewed during technical validation, laboratory evaluation, and specification control, especially when a compliance reference must reflect the amended requirements connected to the parent edition.
Compliance applications of IEC 61000-4-17:1999/AMD1:2001
Organizations may use this amendment when updating test procedures, reviewing procurement specifications, or aligning EMC documentation with the parent test method. It is relevant to product evaluation and test planning for electrical or electronic equipment that depends on a d.c. input power port. In quality workflows, the reference can help ensure that test reports, engineering documentation, and regulatory preparation reflect the correct revision history. IEC 61000-4-17:1999/AMD1:2001 is therefore useful wherever consistent immunity testing and traceable technical assessment are required.
Importance of compliance with IEC 61000-4-17:1999/AMD1:2001
Using the amendment correctly helps reduce ambiguity in EMC testing and supports more reliable conformity assessment. For manufacturers and test laboratories, it can improve consistency between internal procedures and the parent document, which is important for safety, interoperability, and risk management. During procurement and certification review, the amendment may also help teams verify that the correct technical basis is being applied. IEC 61000-4-17:1999/AMD1:2001 is therefore a practical reference for controlled documentation and defensible testing workflows.
- Amendment linked to IEC 61000-4-17:1999 for ripple on d.c. input power port immunity testing
- Supports EMC test planning, laboratory evaluation, and technical validation
- Useful for conformity assessment, compliance workflows, and procurement review
- Helps maintain traceability between the parent document and updated requirements
- Publication Date: 2001-11-07
- Standard Status: Amendment
- Publisher: IEC
- Edition: 1
- New Version Available: IEC 61000-4-17:1999 (2008-11-27)
- This Version: IEC 61000-4-17:1999 (2001-11-07)
- Previous Version: IEC 61000-4-17:1999 (1999-09-06)
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