IEC 61189-2-719:2016

IEC 61189-2-719:2016 defines a test method for assessing relative permittivity and loss tangent in materials used for interconnection structures, across the 500 MHz to 10 GHz range. For engineering teams working on printed boards and related assemblies, this document supports more consistent material evaluation, documented comparison, and technical validation during design and procurement. IEC 61189-2-719:2016 is relevant where dielectric behavior influences signal integrity, product performance, and risk management in high-frequency applications.

What is IEC 61189-2-719:2016?

IEC 61189-2-719:2016 is a technical reference within the IEC 61189 series focused on test methods for materials used in interconnection structures. Based on its title, it addresses how to determine relative permittivity and loss tangent, two properties commonly evaluated when selecting or qualifying board and substrate materials. The document is typically used to support technical review, laboratory evaluation, and conformity assessment activities where dielectric characterization needs to be measured in a controlled and repeatable way.

Applications of IEC 61189-2-719:2016

This document is generally used in laboratories, product development programs, and quality workflows tied to printed boards and interconnection materials. It may support material selection, supplier comparison, incoming inspection, and verification activities for designs operating at higher frequencies. Organizations involved in engineering documentation, testing workflows, or regulatory preparation can use it to align measurement methods and improve operational consistency when evaluating dielectric properties across materials intended for electronic interconnection structures.

Why is IEC 61189-2-719:2016 important?

Reliable dielectric measurements are important because material behavior can affect electrical performance, design margins, and overall technical compliance. IEC 61189-2-719:2016 helps teams apply a defined test approach when assessing relative permittivity and loss tangent, which can reduce ambiguity during product evaluation and procurement review. It is useful for quality assurance, engineering validation, and conformity assessment preparation where consistent test results are needed to support decision-making and reduce project risk.

• Test method for dielectric characterization of interconnection materials in the 500 MHz to 10 GHz range
• Supports laboratory evaluation and repeatable measurement practices for materials used in printed boards and assemblies
• Useful for material selection, supplier qualification, and documented technical review
• Helps align testing workflows with compliance, verification, and quality assurance needs