IEC 61189-2-803:2023 PDF | Request Standard
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IEC 61189-2-803:2023

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-803: Test methods for Z-axis expansion of base materials and printed boards

Standard by IEC, 2023-07-26

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IEC 61189-2-803:2023 defines a focused test method for evaluating Z-axis expansion of base materials and printed boards, making it relevant for material qualification, board reliability assessment, and engineering review. For organizations working with printed circuit substrates and interconnection structures, the document supports consistent measurement and documented evaluation of dimensional behavior under thermal stress. IEC 61189-2-803:2023 is particularly useful when procurement, laboratory evaluation, and compliance workflows need a clear technical reference for comparing materials and validating performance expectations.

What is IEC 61189-2-803:2023?

IEC 61189-2-803:2023 is the technical reference for the test methods used to assess Z-axis expansion in base materials and printed boards. Based on the title, its scope is centered on measurement and verification activities that help characterize how materials expand through the board thickness direction, which can affect interconnection reliability and assembly integrity. It is typically used in technical documentation, quality workflows, and conformity assessment preparation where repeatable laboratory methods are needed for product evaluation and material comparison.

Applications of IEC 61189-2-803:2023

This document is commonly relevant in printed board manufacturing, materials testing, and supplier qualification processes where Z-axis expansion data may influence design decisions or acceptance criteria. It can support laboratory testing, technical assessment of laminate behavior, and engineering documentation for boards used in electronics and related electrical equipment. Teams involved in reliability engineering, product evaluation, and regulatory preparation may use it to align test planning, compare candidate materials, and strengthen consistency across testing workflows.

Why is IEC 61189-2-803:2023 important?

Control of Z-axis expansion is important because dimensional changes in the thickness direction can affect solder joints, vias, and overall board performance during thermal exposure. A defined test method helps reduce variation between laboratories and supports more reliable technical validation during development or procurement review. For organizations managing compliance workflows, the document can improve traceability, support risk management, and provide a defensible basis for quality assurance and conformity assessment preparation.

  • Test method reference for measuring Z-axis expansion in base materials and printed boards
  • Useful for material qualification and comparative product evaluation
  • Supports laboratory evaluation, repeatable testing, and documented technical review
  • Relevant to reliability-focused engineering documentation and procurement decisions
  • Helps align technical validation with compliance and quality workflows
SKU: b6d3c22d5fef

  • Publication Date: 2023-07-26
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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