IEC 61580:1995/COR1:2006

IEC 61580:1995/COR1:2006 is a corrigendum to IEC 61580:1995, providing a formal correction to the document titled Corrigendum 1 - Measurement of return loss on waveguide and waveguide assemblies. For engineering, testing, and procurement teams, it serves as a supporting technical reference when reviewing measurement methods, documentation accuracy, and conformity assessment records related to waveguide return loss. Because return loss is a key parameter in RF and microwave performance evaluation, even a corrigendum can matter in technical review, laboratory evaluation, and compliance workflows.

What is IEC 61580:1995/COR1:2006?

This document is a corrective companion to the parent reference IEC 61580:1995, rather than a standalone test method. It is intended to clarify or amend the published guidance for measuring return loss on waveguide and waveguide assemblies. In practice, that makes IEC 61580:1995/COR1:2006 relevant when organizations need accurate engineering documentation, verified test procedures, or a reliable compliance reference for RF hardware assessment. It helps maintain consistency between the original publication and the corrected technical record.

Applications of IEC 61580:1995/COR1:2006

IEC 61580:1995/COR1:2006 is typically used in workflows involving waveguide components, assemblies, and related laboratory measurements where return loss performance must be documented. It may support technical assessment during product evaluation, incoming inspection, qualification testing, or conformity assessment preparation. Laboratories and manufacturers can use it to align verification activities with the corrected reference text, helping reduce ambiguity in test interpretation and improve operational consistency across engineering documentation and quality workflows.

Why is IEC 61580:1995/COR1:2006 important?

Corrections to technical documents can be important because they affect how test results are interpreted, recorded, and reviewed. IEC 61580:1995/COR1:2006 helps organizations reduce risk during procurement review, compliance checking, and technical validation by ensuring the corrected wording is used alongside the parent document. For teams working on waveguide return loss measurement, it supports clearer conformity assessment, more consistent testing workflows, and better traceability in quality assurance and documented evaluation processes.

• Corrective reference linked to IEC 61580:1995 for return loss measurement on waveguide systems
• Useful for laboratory evaluation, technical review, and documentation control
• Supports conformity assessment and compliance workflows where measurement accuracy matters
• Relevant to procurement and engineering teams managing RF and microwave component records