IEC 61967-2:2005

IEC 61967-2:2005 defines a focused method for measuring radiated electromagnetic emissions from integrated circuits using a TEM cell or wideband TEM cell. It is relevant when engineering teams need a structured way to evaluate emission behavior during product development, verification activities, or compliance preparation. As a technical document tied to EMC assessment, it supports documented evaluation of circuit-level emissions and helps organizations compare results more consistently across laboratory workflows and design iterations.

Overview of IEC 61967-2:2005

IEC 61967-2:2005 addresses integrated circuits in the context of electromagnetic emissions measurement from 150 kHz to 1 GHz, with a method centered on TEM cell and wideband TEM cell testing. The document is typically used as a technical reference for laboratory evaluation where repeatable measurement conditions are important. For engineering and compliance teams, it helps define a common basis for technical assessment, supporting comparison of test data, internal validation, and controlled EMC documentation during product qualification.

Compliance applications of IEC 61967-2:2005

IEC 61967-2:2005 is commonly relevant in workflows involving IC characterization, EMC testing, and pre-compliance review for electronic products and subsystems. It may be used by test laboratories, design groups, and procurement teams that need a clear testing standard for emission requirements related to integrated circuits. The method can support technical validation of device behavior, risk management during product evaluation, and regulatory preparation where consistent measurement practice is needed for engineering documentation and conformity assessment.

Importance of compliance with IEC 61967-2:2005

Using IEC 61967-2:2005 as a compliance reference helps improve testing consistency and reduces uncertainty when comparing electromagnetic emission results across projects or suppliers. It is useful for quality workflows that depend on repeatable laboratory methods, especially when emission data informs design decisions, certification readiness, or procurement review. For organizations managing electrical equipment development, the document can support technical compliance, operational consistency, and better preparation for conformity assessment by aligning measurements with a recognized engineering specification.

• Radiated emission measurement of integrated circuits using TEM cell and wideband TEM cell methods
• Support for EMC-focused laboratory evaluation and documented technical assessment
• Useful reference for pre-compliance testing, product evaluation, and design verification
• Helps standardize measurement practice for procurement, quality assurance, and conformity assessment workflows