IEC 62047-10:2011/COR1:2012
Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
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About This Item
IEC 62047-10:2011/COR1:2012 is a corrigendum linked to the micro-electromechanical devices series, correcting the document for Micro-pillar compression test for MEMS materials. It matters for teams that rely on the parent technical reference because even a small corrigendum can affect how test procedures, results interpretation, or documentation are reviewed in engineering and compliance workflows. For laboratories, procurement teams, and conformity assessment activities, IEC 62047-10:2011/COR1:2012 helps ensure the working document set reflects the corrected published text.
Purpose of IEC 62047-10:2011/COR1:2012
The purpose of IEC 62047-10:2011/COR1:2012 is to amend and clarify the parent reference, IEC 62047-10:2011, which addresses a micro-pillar compression test for MEMS materials. As a corrigendum, it functions as a supporting technical document rather than a standalone test method. In practical use, it helps organizations maintain accurate engineering documentation, support technical review, and reduce ambiguity during verification activities where material testing methods for micro-electromechanical devices are being assessed.
Compliance applications of IEC 62047-10:2011/COR1:2012
IEC 62047-10:2011/COR1:2012 is relevant wherever the parent test method is used in laboratory evaluation, product evaluation, or documentation control for MEMS materials. It may be consulted during conformity assessment preparation, internal quality workflows, and controlled test reporting so that records align with the corrected publication. For organizations managing technical validation or procurement of standards collections, the corrigendum supports a more reliable reference set when reviewing micro-pillar compression test requirements and related engineering specifications.
Benefits of IEC 62047-10:2011/COR1:2012
Using IEC 62047-10:2011/COR1:2012 alongside the parent document can improve testing consistency and reduce the risk of relying on outdated text. That supports better technical assessment, clearer laboratory procedures, and more dependable conformity assessment preparation. For engineering and compliance teams, the corrigendum helps strengthen documentation quality, support risk management, and improve confidence in reported results tied to MEMS material testing. It is especially useful when operational consistency and traceable document control are important to procurement or validation workflows.
- Corrigendum linked to IEC 62047-10:2011 for controlled use with the parent document
- Relevant to micro-electromechanical devices and micro-pillar compression testing of MEMS materials
- Useful for corrected technical review, test documentation, and verification activities
- Supports conformity assessment, quality assurance, and document control processes
- Publication Date: 2012-02-28
- Standard Status: Corrigendum
- Publisher: IEC
- Edition: 1
- This Version: IEC 62047-10:2011 (2012-02-28)
- Previous Version: IEC 62047-10:2011 (2011-07-26)
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