IEC 62132-2:2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
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About This Item
IEC 62132-2:2010 defines a technical basis for measuring the radiated immunity of integrated circuits using TEM cell and wideband TEM cell methods. It is relevant when engineering teams, test laboratories, and procurement specialists need a clear compliance reference for electromagnetic compatibility evaluation. By focusing on repeatable measurement conditions for immunity assessment, the document supports technical review, product evaluation, and documented verification activities for electronic components used in controlled compliance workflows.
Overview of IEC 62132-2:2010
This document is the primary technical reference for the measurement of electromagnetic immunity in integrated circuits when a TEM cell or wideband TEM cell approach is used. IEC 62132-2:2010 is typically consulted during laboratory evaluation and technical validation where radiated immunity behavior must be characterized in a consistent way. Its scope is closely aligned with EMC testing practice, helping organizations compare results, structure engineering documentation, and support conformity assessment for integrated circuit-level assessments.
Compliance applications of IEC 62132-2:2010
IEC 62132-2:2010 is commonly used in testing workflows for integrated circuits that require radiated immunity assessment as part of a broader EMC document set. It may support verification activities in component development, design qualification, and supplier review, especially where technical assessment of immunity requirements is needed before system integration. The reference is also useful for laboratories and quality workflows that need a consistent method for documenting test conditions and results in support of regulatory preparation.
Importance of compliance with IEC 62132-2:2010
Using IEC 62132-2:2010 helps improve testing consistency and reduces uncertainty when evaluating how integrated circuits respond to radiated electromagnetic exposure. This matters for operational consistency, safety-related engineering decisions, and conformity assessment preparation, particularly when results are used in procurement or release decisions. A defined measurement method also supports risk management, because it gives technical teams a structured basis for comparing products, reviewing performance criteria, and maintaining reliable compliance workflows across projects.
- Radiated immunity measurement for integrated circuits using TEM cell and wideband TEM cell methods
- Useful for EMC laboratory evaluation, technical validation, and repeatable test setup documentation
- Supports engineering review, supplier assessment, and product evaluation in compliance workflows
- Helps align immunity testing results with conformity assessment and regulatory preparation needs
- Publication Date: 2010-03-30
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- This Version: IEC 62132-2:2010 (2010-03-30)
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