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IEC 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Standard by IEC, 2017-01-24

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About This Item

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IEC 62435-2:2017 addresses deterioration mechanisms for long-term storage of electronic semiconductor devices, helping engineers and compliance teams understand how stored components may change over time. In procurement, testing, and reliability workflows, this document supports technical review of storage-related risks and the conditions that can affect device integrity before use. IEC 62435-2:2017 is relevant where organizations need a clear technical reference for evaluating storage impact, preserving product quality, and supporting documented evaluation of semiconductor parts intended for extended holding periods.

What is IEC 62435-2:2017?

IEC 62435-2:2017 is the technical reference for identifying and considering deterioration mechanisms associated with the long-term storage of electronic semiconductor devices. Based on its title, the document is centered on understanding how stored devices may age or degrade, which is important for engineering documentation, risk management, and technical validation. It may be used alongside internal quality procedures to support conformity assessment, storage review, and consistency in decision-making for component acceptance or continued use.

Applications of IEC 62435-2:2017

This document is typically useful in semiconductor procurement, incoming inspection, reliability engineering, and laboratory evaluation where long storage intervals may affect component condition. It can support manufacturing organizations, electronics suppliers, and test laboratories that need a structured basis for assessing storage-related deterioration during quality workflows. IEC 62435-2:2017 may also be relevant in technical assessment activities involving component traceability, shelf-life review, and compliance preparation for electronic parts held in inventory before assembly or qualification.

Why is IEC 62435-2:2017 important?

Understanding deterioration mechanisms helps reduce technical uncertainty when semiconductor devices remain in storage for extended periods. The document can support safer engineering decisions, more consistent verification activities, and better alignment between procurement expectations and actual part condition. IEC 62435-2:2017 also assists teams preparing compliance evidence by giving them a recognized technical basis for reviewing storage effects, documenting risks, and maintaining operational consistency in qualification, inspection, and release processes.

  • Focuses on degradation mechanisms relevant to long-term semiconductor storage
  • Supports risk review, product evaluation, and technical documentation workflows
  • Useful for procurement teams checking storage-related acceptance criteria
  • Assists laboratories and engineers with consistency in verification and assessment
  • Helps strengthen quality assurance and conformity assessment preparation
SKU: 0006f7b71940

  • Publication Date: 2017-01-24
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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