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IEC 62562:2010

Cavity resonator method to measure the complex permittivity of low-loss dielectric plates

Standard by IEC, 2010-02-18

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  • Language: English
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IEC 62562:2010 defines a cavity resonator method to measure the complex permittivity of low-loss dielectric plates, making it a relevant technical document for laboratories, engineers, and compliance teams that need dependable dielectric characterization. IEC 62562:2010 is useful when material selection, product evaluation, or verification activities depend on accurate electrical property measurement rather than broad material estimates. For organizations working in technical assessment or documented evaluation workflows, it supports consistent test planning and more defensible engineering decisions.

Overview of IEC 62562:2010

IEC 62562:2010 focuses on a measurement approach based on cavity resonator techniques, with the objective of determining the complex permittivity of low-loss dielectric plates. In practice, that makes it relevant for laboratory evaluation and technical validation where material behavior at electrical frequencies must be assessed with controlled methods. The document is especially useful when a defined testing standard is needed to support engineering documentation, comparison of candidate materials, or conformity assessment activities tied to dielectric performance.

Compliance applications of IEC 62562:2010

This technical reference may be used in material testing programs, procurement review, and quality workflows where dielectric plates must be characterized before integration into electrical or electronic designs. It is also relevant for technical assessment in R&D laboratories, supplier qualification, and verification activities that rely on repeatable measurement methods. Organizations may use IEC 62562:2010 to align test reports, support regulatory preparation, and document measurement results in a way that improves traceability across compliance workflows.

Importance of compliance with IEC 62562:2010

Using IEC 62562:2010 helps reduce ambiguity in how low-loss dielectric materials are measured, which supports more consistent engineering validation and better comparison between test results. For procurement and conformity assessment teams, that consistency can lower risk when evaluating supplier data or approving materials for technical use. The cavity resonator method also contributes to operational consistency in laboratory practice, helping organizations maintain credible documentation for technical review, quality assurance, and compliance decisions.

  • Cavity resonator method for characterizing low-loss dielectric plates
  • Measurement of complex permittivity for laboratory evaluation and technical validation
  • Useful for supplier data review, material qualification, and documented test results
  • Supports repeatable verification activities and conformity assessment preparation
SKU: c632d3ff8205

  • Publication Date: 2010-02-18
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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