IEC 62860:2013 PDF | Request Standard
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IEC 62860:2013

Test methods for the characterization of organic transistors and materials

Standard by IEC, 2013-05-08

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  • Language: English
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About This Item

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IEC 62860:2013 is a technical reference for test methods used in the characterization of organic transistors and materials. It is relevant where laboratories, engineers, and procurement teams need a documented basis for evaluating device behavior, material performance, and measurement consistency. For organizations involved in technical validation or conformity assessment, IEC 62860:2013 can support a more disciplined review of test procedures, helping align engineering documentation and quality workflows around a common characterization approach.

Overview of IEC 62860:2013

IEC 62860:2013, Test methods for the characterization of organic transistors and materials, is primarily concerned with how these devices and materials are examined in a technical test environment. The document is useful when a team needs a reliable compliance reference for laboratory evaluation, comparison of results, or documented evaluation during product development. As an original edition, it serves as the main source for understanding the intended test-method framework and the scope of characterization activities associated with organic transistor technologies.

Compliance applications of IEC 62860:2013

This reference is commonly used in testing workflows that support product evaluation, research verification, and engineering documentation for organic electronic components. It may help laboratories structure measurement methods, compare device samples, and maintain operational consistency across repeated test runs. In procurement and regulatory preparation contexts, IEC 62860:2013 can also function as a technical document used to review whether supplied materials or devices have been assessed using a recognized characterization approach.

Importance of compliance with IEC 62860:2013

Using IEC 62860:2013 can improve testing consistency and reduce ambiguity in technical assessment of organic transistors and related materials. A defined test-method reference supports risk management by making performance claims easier to verify and compare. It is also useful for conformity assessment preparation, where repeatable laboratory practices and clear documentation matter. For engineering and procurement teams, the standard can help establish a stronger basis for technical review, supplier evaluation, and quality assurance decisions.

  • Characterization methods for organic transistors and associated materials
  • Laboratory evaluation and repeatable measurement practices
  • Support for technical review, validation, and conformity assessment workflows
  • Useful reference for engineering documentation and supplier evaluation
SKU: c635e54ca9a7

  • Publication Date: 2013-05-08
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 1

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