IEC TS 61994-4-4:2018 PDF | Request Standard
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IEC TS 61994-4-4:2018

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

Standard by IEC, 2018-11-16

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About This Item

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IEC TS 61994-4-4:2018 provides a focused technical glossary for piezoelectric materials used in frequency control, selection, and detection applications, with specific attention to single crystal wafers for surface acoustic wave (SAW) devices. As a reference document, it helps engineers, laboratories, and procurement teams align terminology before technical review, product evaluation, or conformity assessment. For organizations working with SAW-related components, IEC TS 61994-4-4:2018 supports clearer communication across design, testing, and quality workflows, reducing ambiguity in engineering documentation and compliance preparation.

IEC TS 61994-4-4:2018 standard overview

This document is part of the IEC TS 61994 glossary series and is centered on terminology for piezoelectric materials rather than performance requirements. Its likely purpose is to standardize language used when describing single crystal wafers for SAW devices, which can improve technical validation, documented evaluation, and supplier comparison. In practice, the reference is useful when teams need consistent definitions for specifications, test reports, and regulatory preparation connected to piezoelectric device development and related engineering documentation.

Applications of IEC TS 61994-4-4:2018

IEC TS 61994-4-4:2018 is relevant wherever SAW device materials are specified, reviewed, or tested, especially in frequency control and signal-related electronics workflows. It may support laboratory evaluation, material selection, and technical assessment during component sourcing or design qualification. The glossary can also be useful in procurement reviews, audit files, and manufacturing documentation where consistent terminology is needed to compare wafers, interpret supplier data, and maintain operational consistency across engineering and compliance teams.

Why IEC TS 61994-4-4:2018 matters

Clear terminology is important when teams manage risk management, verification activities, and conformity assessment for piezoelectric materials. By defining the language around single crystal wafers for SAW devices, IEC TS 61994-4-4:2018 can help reduce misinterpretation in technical specifications, test records, and compliance workflows. That consistency is valuable for quality assurance, procurement decisions, and technical validation, particularly when multiple stakeholders need the same reference point for product evaluation and documented evaluation.

  • Terminology support for piezoelectric materials used in SAW device development
  • Useful reference for technical review, supplier communication, and engineering documentation
  • Helps align laboratory evaluation and verification activities with consistent definitions
  • Supports procurement and compliance workflows where precise wording matters
  • Relevant to technical assessment and conformity assessment preparation for related components
SKU: 8de06b38ed0c

  • Publication Date: 2018-11-16
  • Standard Status: Original
  • Publisher: IEC
  • Edition: 3

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