IEEE 1005-1998
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
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- Language: English
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About This Item
IEEE 1005-1998 defines terminology and characterization methods for floating gate semiconductor arrays, providing a common technical basis for discussing these memory-related devices. IEEE 1005-1998 is useful where designers, manufacturers, and test engineers need consistent definitions for device behavior, materials-related characteristics, and performance interpretation. In a field that combines components, circuits, devices, and engineered materials, clear language helps reduce ambiguity during development, comparison, and evaluation.
About IEEE 1005-1998
This standard focuses on the definitions and characterization of floating gate semiconductor arrays, a topic closely tied to semiconductor device engineering and the way memory structures are described and assessed. It is intended to support consistent technical communication by defining key terms and outlining how the arrays are characterized. As an inactive IEEE document, IEEE 1005-1998 remains relevant as a reference point for historical specifications, archival documentation, and legacy design interpretation in semiconductor and materials-related work.
Where is IEEE 1005-1998 used?
IEEE 1005-1998 is mainly relevant in semiconductor design, device qualification, and test environments where floating gate array behavior must be described consistently. It may be consulted in engineering groups working on memory devices, electronics documentation, or materials characterization tied to semiconductor structures. The standard also supports comparison across technical reports, procurement specifications, and lab evaluations, especially when a project depends on precise terminology for device definitions rather than broad product-level descriptions.
Importance in practice
In practice, this standard helps reduce misunderstanding when teams specify, test, or document floating gate semiconductor arrays. Clear definitions support more reliable design control, better alignment between engineering and test results, and more consistent interpretation of technical data. For organizations managing legacy semiconductor information, IEEE 1005-1998 can be useful for maintaining traceability and avoiding conflicts in terminology. That consistency matters when performance data, device descriptions, or acceptance criteria must be compared over time.
- Floating gate array definitions
- Semiconductor device characterization
- Legacy IEEE reference material
- Terminology for engineering and test use
- Publication Date: 1998
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas
- Official IEEE: Doi link
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