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IEEE 1445-1998

IEEE Standard for Digital Test Interchange Format (DTIF)

Standard by IEEE, 1998

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  • Language: English
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  • Language: English
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  • Updates: Included

About This Item

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IEEE 1445-1998 is the standard for Digital Test Interchange Format (DTIF), providing a structured way to exchange digital test information across engineering and validation workflows. In the context of power, energy, and industrial applications, it helps support consistent handling of test data for components, circuits, devices, and systems. By defining a common interchange approach, IEEE 1445-1998 can improve compatibility between tools and reduce errors when moving test content between design, analysis, and verification activities.

IEEE 1445-1998 overview

This standard focuses on the Digital Test Interchange Format used to represent and transfer test-related information in a consistent form. IEEE 1445-1998 is relevant where digital test data must be shared among different software tools, teams, or stages of product development. Its value lies in establishing a common technical basis for exchanging test definitions and results, which can help preserve meaning and structure when data is reused. For organizations working with electronics or industrial systems, that consistency is often essential.

Typical use cases

IEEE 1445-1998 is commonly useful in test environments where digital test information must be exchanged between design verification tools, manufacturing test systems, or engineering analysis platforms. It may support workflows for components, circuits, and devices used in power, energy, and industrial applications. The format can be helpful when teams need to share test content across development stages, compare results from different systems, or maintain a stable record of test definitions for later review and traceability.

Why this standard matters

Using a defined interchange format can reduce ambiguity in test data and support more reliable communication between tools and teams. IEEE 1445-1998 matters because it can help improve consistency in testing, strengthen configuration control, and lower the risk of misinterpretation when digital test information is exchanged. In technical procurement or engineering environments, that consistency is valuable for repeatability, documentation quality, and disciplined verification of components and systems. As a superseded standard, it may still be relevant for legacy data or historical projects.

  • Digital Test Interchange Format
  • Test data exchange
  • Legacy verification workflows
  • Components, circuits, and systems
  • Power and industrial applications
SKU: c07ca04e9b34

  • Publication Date: 1998
  • Standard Status: Superseded
  • Publisher: IEEE
  • Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
  • Official IEEE: Doi link
  • New Version Available: 1445 (2017)
  • This Version: 1445 (1998)

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