IEEE 1671.2-2008
Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
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About This Item
1671.2-2008 is a technical standard for Automatic Test Markup Language (ATML) focused on exchanging instrument descriptions through XML. It supports structured sharing of test equipment information so automatic test systems can interpret instruments more consistently. In the context of components, circuits, devices and broader power and industrial applications, this specification helps reduce ambiguity when test assets and test data need to move between engineering, maintenance, and verification workflows.
About 1671.2-2008
This standard defines a common XML-based approach for representing instrument descriptions within ATML, making it easier to exchange technical details about automatic test equipment. 1671.2-2008 is part of a test information framework intended to improve interoperability between tools, systems, and organizations that manage automated testing. By using a more structured description of instruments, it can support clearer communication of capabilities, configuration, and expected behavior in test environments where consistency is important.
Where is 1671.2-2008 used?
1671.2-2008 is typically used in automated test environments where instrument data must be shared between software tools, test stations, and support systems. That can include validation setups for electronic components, circuit-level diagnostics, equipment integration, and maintenance workflows in power and industrial engineering settings. It is especially relevant where automatic test equipment needs to exchange instrument descriptions in XML so that test configuration, data interpretation, and system integration remain aligned across platforms.
Importance in practice
In practice, 1671.2-2008 helps improve consistency in how instrument descriptions are recorded and exchanged, which can reduce integration errors and support more reliable test execution. For teams responsible for design control, procurement, or compliance verification, a common description format can make it easier to compare equipment, manage test setups, and trace configuration details. As a superseded standard, it remains useful for understanding legacy ATML-based test documentation and archived technical references.
- ATML instrument description exchange
- XML-based test information handling
- Automatic test equipment interoperability
- Legacy test system documentation
- Publication Date: 2008
- Standard Status: Superseded
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
- Official IEEE: Doi link
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