IEEE 1671-2006
Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML
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About This Item
1671-2006 is a technical standard for Automatic Test Markup Language (ATML), focused on exchanging Automatic Test Equipment and test information via XML. It is relevant where power, energy, and industrial systems depend on structured test data that can move between tools and platforms with less ambiguity. As a superseded document, it remains useful for understanding legacy ATML-based implementations, test integration practices, and the requirements that shaped machine-readable interchange in test environments.
1671-2006 overview
This standard addresses how ATML is represented for exchanging automatic test equipment data and associated test information in XML form. In practice, it supports a common structure for describing test-related content so systems can interpret data more consistently across equipment, software, and engineering workflows. For organizations working with complex test setups, 1671-2006 provides a defined technical reference for formatting and sharing information rather than relying on proprietary structures or ad hoc files.
Typical use cases
Typical use cases include test program exchange, automated test data handling, and integration between test equipment and software that reads or generates XML-based records. It may be used in environments where electrical components, circuits, or system-level equipment are validated through repeatable test processes. The standard is especially relevant when teams need consistent markup for test definitions, results, or related metadata across engineering and production test workflows.
Why this standard matters
This standard matters because structured exchange formats help reduce errors when test information moves between systems, suppliers, and internal teams. Using a defined approach can improve consistency in test documentation, support more predictable implementation, and lower the risk of misinterpreted data during testing or procurement. For legacy ATML-based applications, 1671-2006 also helps preserve compatibility and provides a clear reference point for compliance, validation, and engineering review.
- ATML exchange using XML
- Automatic test equipment data
- Test information interoperability
- Legacy test workflow support
- Structured engineering documentation
- Publication Date: 2006
- Standard Status: Superseded
- Publisher: IEEE
- Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
- Official IEEE: Doi link
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