IEEE 1671.3-2007
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
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About This Item
IEEE 1671.3-2007 is a standard for Automatic Test Markup Language (ATML) focused on exchanging unit under test (UUT) description information through XML. It supports structured communication of test-related product data, which is important in automated test environments where consistency and traceability matter. In power, energy, and broader industrial applications, this type of specification helps define how UUT details are represented so test systems can interpret them more reliably across tools and workflows.
About IEEE 1671.3-2007
This standard addresses the XML-based exchange of UUT description information within the ATML framework. IEEE 1671.3-2007 is intended to help standardize how test-oriented descriptions are formatted and shared, reducing ambiguity between systems that create, store, or consume automatic test information. As part of the IEEE 1671 series, it is relevant to environments that depend on repeatable electronic test data, especially where equipment descriptions must be handled in a consistent technical structure.
Where is IEEE 1671.3-2007 used?
IEEE 1671.3-2007 is commonly used in automated test systems that need to exchange descriptive information about a unit under test, such as production test setups, maintenance test workflows, and integrated test software. It is especially relevant where electrical components, devices, circuits, and industrial equipment are evaluated using structured data. In these settings, the standard helps support clearer data handoff between test development, test execution, and documentation processes.
Importance in practice
Using IEEE 1671.3-2007 can improve consistency in how UUT descriptions are recorded and exchanged, which may reduce integration errors and support better test control. For organizations managing technical test data, a defined XML structure helps with compliance, procurement review, and traceable engineering records. It can also make automated testing more dependable by helping different systems interpret the same description information in a uniform way, which is valuable when repeatability and risk reduction matter.
- ATML XML exchange for UUT descriptions
- Automatic test information structure
- Test data consistency and traceability
- Industrial and electrical test workflows
- Superseded IEEE standard reference
- Publication Date: 2008
- Standard Status: Superseded
- Publisher: IEEE
- Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
- Official IEEE: Doi link
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