IEEE 1671.5-2008
Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
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About This Item
1671.5-2008 is a technical standard for Automatic Test Markup Language (ATML) focused on exchanging automatic test information via XML, specifically for test adapter information. It is relevant where electronic components, circuits, devices, and systems must share test data in a structured way. By defining a common exchange format, it helps support consistent communication between test tools, adapters, and related engineering workflows, which can improve interoperability and reduce ambiguity in automated testing environments.
1671.5-2008 overview
This standard addresses the XML-based exchange of test adapter information within the ATML family. In practical terms, it provides a structured way to represent adapter-related details so automated test systems can interpret and share them more reliably. As a superseded standard, 1671.5-2008 remains important for understanding older ATML implementations, archived test documentation, and legacy integration requirements. It is especially relevant where test information must move between tools without losing technical meaning.
Typical use cases
Common use cases include automated test environments that need to describe, store, or transfer test adapter information across systems used for electronic devices and related assemblies. This may include production test setups, maintenance test stations, and engineering validation workflows where XML exchange improves traceability. It can also support organizations working with legacy ATML-based data structures that depend on consistent formatting for adapter descriptions, interface details, or test support documentation.
Why this standard matters
Using a defined exchange standard helps reduce errors when test adapter information is shared between different software tools or hardware platforms. For teams managing compliance, configuration control, or test procedure consistency, 1671.5-2008 can help preserve meaning in XML-based records and limit manual rework. It also supports clearer procurement and integration decisions by giving stakeholders a common reference for how automatic test information should be structured and interpreted in technical environments.
- ATML XML exchange format
- Test adapter information
- Automated test interoperability
- Legacy test data support
- Electronic systems and devices
- Publication Date: 2008
- Standard Status: Superseded
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
- Official IEEE: Doi link
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