IEEE 62526-2007
IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
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About This Item
IEEE 62526-2007 is a technical standard for extensions to Standard Test Interface Language (STIL) in semiconductor design environments. It addresses how test data and interface descriptions can be expanded to better support device characterization, pattern development, and design verification workflows. For engineering teams working with components, circuits, and semiconductor test systems, this document helps improve consistency in how test intent is represented and exchanged, which can reduce integration issues and support more reliable testing.
Overview of IEEE 62526-2007
This standard builds on IEC 62526 Ed. 1 and IEEE Std 1450.1(TM)-2005 by defining extensions to STIL for semiconductor design environments. Its purpose is to make test interface language more adaptable to practical design and test needs, especially where standard descriptions must be extended for specific device or workflow requirements. IEEE 62526-2007 is relevant to teams that need a structured way to document and manage test-related information across development, validation, and manufacturing-oriented engineering processes.
Typical use cases
The document is commonly used when defining semiconductor test programs, creating reusable test descriptions, or coordinating data between design and automatic test equipment workflows. It can be useful in environments where engineers need a consistent way to describe interface behavior, signal relationships, or extensions to STIL-based test content. Applications may include IC design verification, wafer-level or device-level testing, and engineering support for test development in semiconductor and electronics systems.
Why it matters
IEEE 62526-2007 matters because test language consistency is important when moving from design intent to executable test content. A clear extension mechanism can help reduce interpretation errors, improve compatibility across tools, and support more controlled test development. For organizations managing semiconductor products, the standard may also aid procurement and compliance discussions by providing a defined technical reference for how STIL is extended in design environments. Using IEEE 62526-2007 can support better traceability and lower integration risk.
- STIL extensions for semiconductor environments
- Test description and interface consistency
- Design, verification, and test development support
- Relevant to components, circuits, and devices
- Publication Date: 2007
- Standard Status: Active
- Publisher: IEEE
- Subject: Components, Circuits, Devices and Systems; Power, Energy and Industry Applications
- Official IEEE: Doi link
- This Version: 62526 (2007)
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