IEEE P1450.1/D2, Aug 2024 PDF | Request Standard
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IEEE P1450.1/D2, Aug 2024

IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

Standard by IEEE, 2024

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  • Language: English
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  • Language: English
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  • Updates: Included

About This Item

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IEEE P1450.1/D2, Aug 2024 is a draft IEEE standard focused on extensions to Standard Test Interface Language (STIL) for semiconductor design environments. It is relevant where test data, device behavior, and design verification need a common language across components, circuits, and systems. By clarifying how STIL is extended, IEEE P1450.1/D2, Aug 2024 supports more consistent communication between design and test workflows in semiconductor engineering.

IEEE P1450.1/D2, Aug 2024 overview

This draft standard builds on IEEE Std 1450-1999 by addressing extension points for STIL in semiconductor design environments. Its technical context is centered on test interface description, pattern representation, and related design-and-test exchange needs. IEEE P1450.1/D2, Aug 2024 is therefore useful for teams that work with semiconductor test specifications and need a controlled way to express additional capabilities without losing compatibility with the underlying language framework.

Typical use cases

IEEE P1450.1/D2, Aug 2024 is commonly used when defining or reviewing STIL-based test content for semiconductor devices, especially in environments where design data and manufacturing test data must align. It may support digital IC verification, automated test pattern development, and communication between design teams and test engineers. The standard is also relevant in workflows that involve test program preparation, interface documentation, and structured handling of device-level test requirements.

Why this standard matters

This standard matters because semiconductor testing depends on precise, repeatable descriptions of interface behavior and test intent. IEEE P1450.1/D2, Aug 2024 can help reduce ambiguity when extending STIL, which supports better design control and more reliable test implementation. Clearer language also improves consistency across organizations and tools, lowering the risk of interpretation errors during compliance checks, validation, and procurement of test-related engineering deliverables.

  • STIL extension framework
  • Semiconductor design environments
  • Test pattern and interface description
  • Design-to-test data exchange
  • Draft IEEE standard, inactive status
SKU: c02ba047c907

  • Publication Date: 2024
  • Standard Status: Inactive
  • Publisher: IEEE
  • Subject: Components, Circuits, Devices and Systems; Computing and Processing
  • Official IEEE: Doi link

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