IEEE P1671.2/D9, Apr 2008
Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML: Exchanging Instrument Descriptions
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About This Item
P1671.2/D9, Apr 2008 is a technical standard draft focused on Automatic Test Markup Language (ATML) for exchanging instrument descriptions through XML. In the context of power, energy, and industrial systems, it supports clearer communication of test equipment details and related test information. This standard is relevant where consistent machine-readable descriptions help improve interoperability, reduce ambiguity, and support more reliable automatic test equipment workflows.
Overview of P1671.2/D9, Apr 2008
P1671.2/D9, Apr 2008 addresses the exchange of instrument descriptions within the broader ATML framework, using XML-based structure to represent test equipment information. Its purpose is to help standardize how automatic test equipment and test systems describe instruments, making data easier to share and process across tools and organizations. For teams working with complex electronic or industrial test environments, this technical document can support more consistent integration and documentation practices.
Typical use cases
This standard may be used when describing instruments for automated test systems, especially where test setups need to move information between software tools, configuration databases, or equipment interfaces. It can be relevant in power and industrial applications that rely on automatic test equipment, such as verification of components, circuits, devices, and system-level test stations. P1671.2/D9, Apr 2008 is also useful when instrument descriptions must remain readable, structured, and exchangeable across XML-based workflows.
Why it matters
Clear instrument descriptions are important for consistency, traceability, and test repeatability. By supporting a common XML approach, P1671.2/D9, Apr 2008 can reduce interpretation errors when test information is shared across engineering teams, test platforms, or procurement processes. That can help improve design control, simplify integration, and lower the risk of mismatched equipment data in automated environments. For organizations managing test infrastructure, the standard may contribute to more dependable and maintainable workflows.
- ATML instrument description exchange
- XML-based test information structure
- Automatic test equipment interoperability
- Industrial and power-system test workflows
- Machine-readable equipment definitions
- Publication Date: 2008
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
- Official IEEE: Doi link
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