IEEE P1671.3/D6, May 2007
Use Standard for Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML (Xtensible Markup Language): Exchanging UUT (Unit-Under-Test) Description Information
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About This Item
P1671.3/D6, May 2007 is a technical standard draft for Standard Automatic Test Markup Language (ATML), focused on exchanging automatic test information via XML for Unit-Under-Test (UUT) description data. It is relevant to power, energy, and industrial systems where test information must be structured, shared, and interpreted consistently across equipment and engineering workflows. As a specialized document, P1671.3/D6, May 2007 helps define how UUT descriptions are represented for automated test environments.
Overview of P1671.3/D6, May 2007
This standard draft addresses a specific portion of ATML: the exchange of UUT description information using XML. In practical terms, it supports a common data structure for describing the item being tested, which can improve alignment between test software, test equipment, and documentation. P1671.3/D6, May 2007 is part of a broader effort to make automatic test information more interoperable, especially in technical environments where consistent data handling is important for engineering and verification activities.
Typical use cases
P1671.3/D6, May 2007 may be used when test teams need to exchange UUT descriptions between automated test systems, test development tools, or data repositories. It is relevant in equipment-level verification, production test support, maintenance diagnostics, and engineering validation for components, circuits, devices, and systems. The standard can also support organizations that manage XML-based test artifacts and need a consistent way to identify and describe the unit under test across different tools or departments.
Why it matters
Clear UUT description exchange can reduce ambiguity in automated testing and improve consistency across test programs, review processes, and procurement specifications. By using a defined approach for XML-based test information, P1671.3/D6, May 2007 may help limit integration problems and support better traceability of test data. For organizations working with complex electrical or industrial equipment, this can aid design control, testing repeatability, and safer handoff between engineering and test operations.
- ATML-based UUT description exchange
- XML structure for test information
- Automated test interoperability
- Applicable to equipment and system test workflows
- Supports consistent technical data handling
- Publication Date: 2007
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
- Official IEEE: Doi link
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