IEEE P1671.4/D6, May 2007 PDF | Request Standard
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IEEE P1671.4/D6, May 2007

Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML, Exchanging Test Configuration Information

Standard by IEEE, 2007

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About This Item

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P1671.4/D6, May 2007 is a draft standard focused on Automatic Test Markup Language (ATML) for exchanging automatic test equipment and test information via XML, with particular attention to exchanging test configuration information. In the context of power, energy and industrial applications, it supports more structured communication between test systems and related engineering tools. For organizations handling complex test setups, P1671.4/D6, May 2007 can help improve consistency and interoperability across test data exchange workflows.

P1671.4/D6, May 2007 overview

This specification addresses the exchange of test configuration information within an ATML-based environment. P1671.4/D6, May 2007 is intended to define how configuration data is represented and shared so that automatic test equipment and supporting systems can interpret test setups more reliably. As an XML-oriented technical document, it is relevant where test definitions, equipment settings, and configuration details need a common format for engineering review, integration, and controlled use across a test process.

Typical use cases

P1671.4/D6, May 2007 may be used in environments where test stations must exchange configuration details with software tools, databases, or other equipment management systems. Typical workflows include documenting test setup parameters, transferring configuration data between automated test systems, and maintaining consistent test definitions for validation or analysis. It is especially relevant where industrial or energy-related equipment testing requires repeatable configuration handling and a structured XML-based approach to test information exchange.

Why this standard matters

In practice, P1671.4/D6, May 2007 helps reduce ambiguity in how test configuration information is recorded and transferred. That matters when teams need dependable compliance checks, repeatable test execution, and lower risk of setup errors across automatic test equipment. Using a common specification can support better control of engineering data, smoother integration between systems, and more consistent test results during procurement, development, or qualification activities. For inactive standards references, it also helps maintain clarity when reviewing legacy test documentation.

  • ATML test configuration exchange
  • XML-based data representation
  • Automatic test equipment interoperability
  • Configuration control and consistency
  • Legacy test documentation reference
SKU: 580632c512b8

  • Publication Date: 2007
  • Standard Status: Inactive
  • Publisher: IEEE
  • Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
  • Official IEEE: Doi link

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