IEEE P1671.5/D6, July 2008 PDF | Request Standard
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IEEE P1671.5/D6, July 2008

Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML, Exchanging Test Adapter Information

Standard by IEEE, 2008

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About This Item

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P1671.5/D6, July 2008 is a technical standard focused on Automatic Test Markup Language (ATML) for exchanging automatic test information via XML, with particular attention to exchanging test adapter information. In practical terms, it helps define a structured way to describe and move test-related data between systems used in power, energy, and industrial applications. This makes the document relevant where test assets, adapter details, and machine-readable data exchange need to stay consistent across engineering and test workflows.

About P1671.5/D6, July 2008

P1671.5/D6, July 2008 addresses the exchange of test adapter information within the ATML framework, using XML as the underlying format. The standard is intended to support clearer interoperability between tools that create, store, or consume automatic test information. For organizations working with electronic components, circuits, devices, and system-level test environments, this technical document can help align data structures and reduce ambiguity when adapter-related information is shared across systems or teams.

Where is P1671.5/D6, July 2008 used?

This standard is typically used in environments that manage automated testing, especially where test adapters must be identified, described, or exchanged between software tools and test equipment. That may include engineering labs, validation groups, manufacturing test stations, and support workflows for power and industrial electronics. P1671.5/D6, July 2008 is most relevant when test information needs to move cleanly through XML-based processes and remain understandable across different parts of a test program.

Importance in practice

In practice, the value of P1671.5/D6, July 2008 is consistency. A defined approach to test adapter information can help reduce errors in test setup, improve traceability, and support more reliable data exchange between systems. For procurement, compliance, and test engineering teams, a shared technical format may simplify integration and help avoid misunderstandings about adapter configuration or test requirements. That can lower rework and support more dependable automated testing results.

  • ATML-based XML data exchange
  • Test adapter information definition
  • Automatic test environment interoperability
  • Engineering and validation workflows
  • Inactive standard reference
SKU: f73992a9ee02

  • Publication Date: 2008
  • Standard Status: Inactive
  • Publisher: IEEE
  • Subject: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems
  • Official IEEE: Doi link

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