IEEE P1671.6/D10, Jan 2015
IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Test Station Description
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About This Item
IEEE P1671.6/D10, Jan 2015 is an approved draft standard for Automatic Test Markup Language (ATML) Test Station Description, aimed at documenting how a test station is defined within computing and processing environments. It supports a consistent way to describe station capabilities, configuration, and related test information, which can help teams exchange technical data more reliably. For organizations working with automated test systems, IEEE P1671.6/D10, Jan 2015 provides a structured reference for clearer specification and integration.
Overview of IEEE P1671.6/D10, Jan 2015
This draft standard focuses on the ATML test station description within the IEEE P1671.6 family of technical documents. Its role is to support a formal description of test station characteristics so that automated test resources can be identified and understood in a consistent way. In practice, IEEE P1671.6/D10, Jan 2015 is relevant where test software, station configuration, and documentation need to align across engineering and verification activities. That makes it useful for controlled technical environments that depend on repeatable test data.
Typical use cases
IEEE P1671.6/D10, Jan 2015 is typically used when defining or exchanging ATML-based descriptions of test stations in automated test setups. It may apply to diagnostic benches, equipment validation stations, and other computer-supported test environments where station identity and configuration matter. The standard can also help when organizations need a common structure for documenting test resources, supporting system integration, and keeping test-related information consistent across development, production, or maintenance workflows.
Why it matters
Using IEEE P1671.6/D10, Jan 2015 can improve consistency in how test stations are described, which supports clearer communication between engineering, test, and support teams. That consistency may reduce integration issues, help with controlled configuration management, and make technical reviews more dependable. For procurement, compliance, and verification work, a shared standard can also lower the risk of ambiguity in test documentation. In computing and processing applications, that kind of structure is often important for repeatable results and traceable test setup.
- ATML test station description
- Automated test system documentation
- Configuration and capability identification
- Engineering and verification support
- Publication Date: 2015
- Standard Status: Inactive
- Publisher: IEEE
- Subject: Computing and Processing
- Official IEEE: Doi link
- This Version: P1671.6 (2015)
- Previous Version: P1671.6 (2014)
- Previous Version: P1671.6 (2008)
- Previous Version: P1671.6 (2008)
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