IEEE PC95.1a/D1.4, Jun 2009 PDF | Request Standard
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IEEE PC95.1a/D1.4, Jun 2009

Amendment: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Density

Standard by IEEE, 2009

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About This Item

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PC95.1a/D1.4, Jun 2009 is an inactive technical amendment in the PC95.1 series that addresses exposure limits for induced and contact current, with added clarification on the distinction between localized exposure and spatial peak power density. In the field of Fields, Waves and Electromagnetics, this document is relevant where electrical and RF exposure controls must be interpreted carefully. It helps engineers and compliance teams apply the correct limits and terminology when evaluating safety-related design and test conditions.

What is PC95.1a/D1.4, Jun 2009?

PC95.1a/D1.4, Jun 2009 is a standards document that refines the technical treatment of current and power density exposure limits. Its main purpose is to specify ceiling limits for induced current and contact current while clarifying how localized exposure relates to spatial peak power density. That makes the document useful for aligning measurement, interpretation, and compliance practices in electromagnetic safety work. As a technical amendment, it is best understood in relation to the broader PC95.1 framework.

Where is PC95.1a/D1.4, Jun 2009 used?

This standard is typically used in environments that assess human exposure to electromagnetic fields, especially where induced current or contact current may be a concern. It may support compliance reviews for RF-emitting equipment, high-field test setups, and engineering evaluations tied to localized exposure limits. PC95.1a/D1.4, Jun 2009 is also relevant when teams need consistent definitions for power density measurements and safety thresholds in design, documentation, or verification workflows.

Why is PC95.1a/D1.4, Jun 2009 important?

The value of PC95.1a/D1.4, Jun 2009 lies in reducing ambiguity around exposure assessment. By setting ceiling limits for induced and contact current and clarifying how localized exposure differs from spatial peak power density, it supports more consistent compliance decisions and safer engineering practice. That can help avoid misinterpretation during testing, procurement, or system approval. For organizations working with electromagnetic fields, the standard provides a clearer basis for risk control and technical consistency.

  • Induced current ceiling limits
  • Contact current considerations
  • Localized exposure definitions
  • Spatial peak power density clarification
  • Electromagnetic safety compliance support
SKU: 91b7057b1537

  • Publication Date: 2009
  • Standard Status: Inactive
  • Publisher: IEEE
  • Subject: Fields, Waves and Electromagnetics
  • Official IEEE: Doi link
  • New Version Available: PC95.1 (2020)
  • Previous Version: PC95.1 (2019)
  • Previous Version: PC95.1 (2019)
  • Previous Version: PC95.1 (2018)
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  • Previous Version: PC95.1 (2014)
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  • Previous Version: PC95.1 (2010)
  • This Version: PC95.1 (2009)
  • Previous Version: PC95.1 (2005)
  • Previous Version: PC95.1 (2005)
  • Previous Version: PC95.1 (2004)

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