SAE ARP6338 PDF | Request Standard
Historical

SAE ARP6338

Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits

Standard by SAE International, 2015-12-06

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  • Availability: Immediate Download
  • Language: English
  • License Type: Single User
  • Updates: Not Included
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  • Language: English
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  • Updates: Included

About This Item

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the ADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process. As microcircuit technology progresses, the risk of early wearout increases for aerospace users. The aerospace industry needs to have a standardized approach to analysis and testing for wearout, to ensure reliability of future products, without introducing competitive disadvantages to those who address the issue effectively.
SKU: 815ef79999ab

  • Publication Date: 2015-12-06
  • Standard Status: historical
  • Publisher: SAE International
  • Document Type: Aerospace Standard
  • Subject: Product development, Design processes, Risk assessments, Semiconductor devices, Failure modes and effects analysis, Suppliers, Manufacturing processes, Electronic equipment,
  • Official SAE: Doi link
  • New Version Available: ARP6338A (2019-02-08)
  • This Version: ARP6338 (2015-12-06)

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