SAE ARP7519

This SAE Aerospace Recommended Practice (ARP) is not a certification document; it contains no certification requirements beyond those already contained in existing certification documents. The purpose of this ARP is to provide: a Guidelines for potential usage of life samples depending upon the mission environment and at user discretion to use them or not. b Guidelines of: 1 Who approves the parts to be used. 2 Notification requirements to manufacturers. 3 Traceability and segregation. 4 Packing and labeling of such parts. This ARP does not claim that the recommended practices and artifacts described herein are the only acceptable ones. They are, however, used widely today, and merit serious consideration of potential usage where applicable in the military and space hardware. This ARP does not supersede any contracts or legal agreements between contractual parties. This SAE Aerospace Recommended Practice (ARP) describes practices that may support potential usage of life test samples of integrated circuits, microcircuits, multi-chip modules (MCM), hybrid microcircuits, and semiconductor devices as defined in MIL-PRF, MIL-PRF-38535, MIL-PRF-38534, and MIL-PRF-19500. It provides guidelines of when and how such potential life test samples can be used. At this time, guidance is only provided for potential usage of life test samples based on mission criticality as determined by the user authority. This ARP is based on industry best practices for use of such life test samples to be potentially used for flight parts; it does not provide any recommendation if such samples can be used for flight. The final decision of usage of any life test samples lies with the user authority after considering the complexity levels of components, or assurance levels of hardware along with mission criticality.