SAE AS6294/3

This document establishes the requirements for screening, qualification, and lot acceptance testing of Plastic Encapsulated Discrete Semiconductors (PEDS) for use in space application environments. The scope of this document is intended for standard silicon based technology only, but the process and methodology described within can be adopted for other technologies such as Silicon Carbide, Gallium Nitride, and Gallium Arsenide. However, when non-silicon based technology parts are being used, the device characterization shall be modified, and it is recommended to use available industry standards based upon published research/testing reports for those technology to address applicable physics of failure. This document defines the requirements for screening, qualification, and lot acceptance testing for use of plastic encapsulated discrete semiconductors (PEDS) in space flight applications. The level of testing on PEDS should be dependent on a risk based approach, the application, reliability and radiation requirements of the mission. It shall be the responsibility of the user to have the tests conducted using the requirements specified herein. Reporting procedures shall be documented on how the tests are conducted and results obtained. This document addresses many of the concerns associated with PEDS, such as narrower operating temperature ranges and greater susceptibility to infant mortality and moisture absorption than space grade products.