Historical

SAE J1752/3_199503

Name: SAE J1752/3_199503 PDF | Request Standard
SKU: c7cb0480ffc7

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS MEASUREMENT PROCEDURE 150 KHZ TO 1000 MHZ, TEM CELL

Standard by SAE International, 1995-03-01

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SAE J1752/3_199503.PDFSecure PDF
SAE J1752/3_199503.PDFOnline Access

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Language: English
License Type: Single User
Updates: Not Included

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Language: English
License Type: Enterprise / Multi User
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About This Item

This SAE Recommended Practice defines a method for measuring the electromagnetic radiation from an integrated circuit. The method uses a standardized IC test board containing the IC being evaluated mounted to a mating port cut in the top or bottom of a 1 GHz TEM cell. The standardized test board controls the geometry and orientation of the operating IC relative to the TEM cell and eliminates any connecting leads within the cell (these are on the back side of the board which is outside the cell). One of the TEM cell feeds is terminated with a 50 Ω load and the other one is connected to the input of a spectrum analyzer which measures the RF emissions over the frequency range of 150 kHz to 1000 MHz emanating from the integrated circuit and impressed onto the septum of the TEM cell (see Figure 1).

SKU: c7cb0480ffc7

Publication Date: 1995-03-01

Standard Status: historical

Publisher: SAE International

Document Type: Ground Vehicle Standard

Subject: Integrated circuits, Electromagnetic compatibility, Emissions measurement, , , , , ,

Official SAE: Doi link

New Version Available: J1752/3_201709 (2017-09-22)
Previous Version: J1752/3_201106 (2011-06-17)
Previous Version: J1752/3_200301 (2003-01-21)
This Version: J1752/3_199503 (1995-03-01)

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