TS 5822-1 ISO 5725-1

TS 5822-1 ISO 5725-1 is the foundational part of the series dealing with the accuracy of measurement methods and results, bringing trueness and precision into a single technical framework. It explains the general principles to be considered when evaluating a method’s performance and supports practical estimation of accuracy-related measures from experimental data.

How trueness and precision fit into measurement accuracy

In metrology and experimental testing, accuracy is not a single attribute. It is understood through the combined behaviour of trueness and precision. Trueness describes closeness to a reference value, while precision describes the spread of repeated results. In general technical practice, this distinction matters because a method may be highly consistent yet biased, or it may average near the target while still producing widely scattered results.

What this part establishes

This part sets out the general principles for understanding and assessing the accuracy of measurement methods and results, and it provides a basis for practical estimation of various accuracy measures from experiments. As a general framework document, it supports the interpretation of measurement data in laboratories, calibration work and method evaluation, rather than prescribing a single instrument-specific test procedure.

• Organises the core concepts used when discussing measurement result quality.
• Treats trueness and precision as distinct but complementary components of accuracy.
• Provides shared terminology for experimental estimation of accuracy-related measures.
• Serves as a general reference framework for metrology, laboratory comparison and method assessment.

This record should also be understood as part of the TS 5822 series; the referenced companion parts complete the broader subject of accuracy in different aspects and applications. According to the catalog status, this edition has been withdrawn, but its subject remains a well-established basis for understanding accuracy concepts in metrology.