TS 6956 EN ISO 4287
Geometrical product specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters
This Standard specifies terms, definitions and parameters for the determination of surface texture (roughness, waviness and primary profile) by profiling methods
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About This Item
TS 6956 EN ISO 4287 is a technical standard for the terms, definitions and surface texture parameters used in the profile method of surface texture assessment. In metrology terms, surface texture brings together the microscopic irregularities of a manufactured surface, the longer-wavelength waviness of that surface, and the primary profile used during measurement and evaluation.
How the profile method interprets a surface
The profile method addressed by this standard works from a line trace taken across the surface. In general technical usage, this means the surface is not described only as a full three-dimensional landscape; instead, features along a selected measurement line are analysed and classified. That is why roughness, waviness and primary profile are treated as distinct concepts: roughness refers to short-spacing fine irregularities, waviness to more widely spaced undulations, and primary profile to the overall profile before detailed separation of components.
Parameters and common technical language
The standard provides a shared terminology for the parameters used to describe surface texture, helping users interpret measured values consistently. It clarifies what profile-based parameters represent, which surface component they belong to, and how they should be named in drawings, inspection records and quality specifications. This common language is important because surface finish influences fit, sliding behaviour, sealing performance, wear and appearance in many engineering applications.
This TSE listing is based on EN ISO 4287 and is withdrawn, but it remains a useful reference for understanding the core concepts of surface texture metrology. In practice, profile-based surface assessment is commonly used together with related standards that define measurement conditions, filtering and evaluation conventions.
- Publication Date: 6.04.2004
- Standard Status: H (İptal Edilmiş Standard/Withdrawn standard)
- Publisher: TSE
- Document Language: tr, en, fr, de
- ICS Classification: 01.040.17 Metroloji ve Ölçme, Fiziksel Olaylar (Terimler); 17.040.20 Yüzeylerin Özellikleri
- Pages: 22
- Source Standard: EN ISO 4287:1998
- International Equivalents: EN ISO 4287-EQV; ISO 4287 -EQV; DIN EN ISO 4287 -EQV; NF E05-015, NF EN ISO 4287 -EQV; BS EN ISO 4287-EQV
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