TS EN ISO 21920-2

TS EN ISO 21920-2 is the standard that sets out the terms, definitions and surface texture parameters used when surface texture is determined by profile methods within the GPS framework. It provides a common language for expressing profile-based surface texture information and for aligning the concepts used in measurement and specification.

Why profile-based surface texture terminology matters

Surface texture describes the small-scale features of a manufactured surface, including roughness and waviness, and how those features are separated and interpreted in measurement. Profile methods assess the surface along a line section rather than over an area, which makes them widely used in manufacturing, inspection and technical documentation. The terms and parameters covered by this standard help ensure that profile data are understood consistently and compared on a like-for-like basis.

What this standard focuses on

• terms related to determining surface texture by profile methods
• definitions used to harmonise the profile-texture vocabulary
• the conceptual basis for surface texture parameters
• its relationship to profile and areal standards within the GPS matrix model

In general technical use, a surface texture parameter is meaningful only when its reference line, filtering approach and evaluation length are understood as part of the result. Clear terminology is therefore essential for consistent interpretation and communication between designers, manufacturers and metrology personnel. The standard also points readers to the broader GPS matrix model context, helping them understand how profile standards relate to areal surface standards without treating those broader links as separate requirements of this document.