TS EN ISO 25178-73

TS EN ISO 25178-73 brings together the terms and definitions used for geometric defects that may appear on the surfaces of material measures and calibration specimens in the context of areal surface texture metrology. It clarifies how these defects are named and also organizes the concepts used to decide how such defects are handled, giving users a common vocabulary for interpreting measurements.

Why defects on material measures matter

In general technical terms, material measures are physical artefacts used as references in surface metrology to represent nominal geometry and surface characteristics. Surface defects such as scratches, pits, contamination, edge damage, or manufacturing marks can affect the choice of measuring area and the reliability of the reported result. Distinguishing defect types is therefore important when deciding which regions should be included in, or excluded from, a measurement.

Where the standard is applied

• Defines classes of surface defects for material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70.
• Helps manufacturers, customers, and users specify nominal features more clearly when procuring material measures.
• Supports users in setting their own rules for responding to defects in ways that help minimize measurement uncertainty.
• Helps calibration laboratories and their customers agree on a common policy for handling defects on a material measure sent for calibration.
• Provides terminology that other GPS standards can reference when dealing with measuring-location selection or areas to be measured or avoided.

This part is not just a list of defect names; it links defect terminology to measurement practice. That makes it easier to discuss whether a defect should be treated as part of the surface to be measured or as a local condition that affects how the measurement is planned and interpreted. The result is more consistent communication about defect significance and measurement policy across the surface texture workflow.