IEC 60191-2X:1999
Mechanical standardization of semiconductor devices - Part 2: Dimensions
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About This Item
IEC 60191-2X:1999 addresses Mechanical standardization of semiconductor devices - Part 2: Dimensions, making it relevant for organizations that need a consistent reference for component geometry, package-related documentation, and engineering comparison. For teams involved in technical review, procurement checks, or conformity assessment, IEC 60191-2X:1999 helps establish a common basis for evaluating device dimensions and related drawings. It is a practical compliance reference where dimensional consistency supports reliable specification control and documented evaluation.
Purpose of IEC 60191-2X:1999
The purpose of Mechanical standardization of semiconductor devices - Part 2: Dimensions is to support standardized dimensional information for semiconductor device packaging and related mechanical interfaces. In engineering and quality workflows, that kind of reference is important for interpreting device outlines, comparing supplier data, and aligning design assumptions across teams. IEC 60191-2X:1999 can therefore assist with technical validation, drawing review, and controlled documentation when dimensional compatibility matters in component selection or product development.
Compliance applications of IEC 60191-2X:1999
IEC 60191-2X:1999 is commonly useful in compliance workflows involving semiconductor components, where dimensional data must be checked against internal specifications, customer requirements, or procurement records. It may support laboratory evaluation, incoming inspection, and engineering documentation for assemblies that depend on package fit, mounting space, or mechanical interchangeability. For organizations managing technical assessments across product lines, it can help maintain operational consistency and reduce avoidable mismatch during design verification or supplier qualification.
Benefits of IEC 60191-2X:1999
Using IEC 60191-2X:1999 in technical and procurement processes can improve consistency in how semiconductor device dimensions are interpreted and recorded. That supports better engineering validation, clearer product evaluation, and more predictable conformity assessment preparation. It may also reduce risk in sourcing decisions by providing a stable reference for comparing device outlines and documentation. For teams working on quality assurance and compliance, the document can contribute to more dependable review cycles and fewer ambiguities during specification control.
- Supports dimensional review for semiconductor device packaging and mechanical standardization
- Useful for supplier comparison, drawing verification, and component selection workflows
- Helps align technical documentation with conformity assessment and quality assurance processes
- Relevant to engineering teams checking fit, interface compatibility, and package-related constraints
- Publication Date: 1999-09-30
- Standard Status: Original
- Publisher: IEC
- Edition: 1
- New Version Available: IEC 60191-2X:1999 (2000-01-31)
- This Version: IEC 60191-2X:1999 (1999-09-30)
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