IEC 60747-1:2006/AMD1:2010
Amendment 1 - Semiconductor devices - Part 1: General
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About This Item
IEC 60747-1:2006/AMD1:2010 is a supporting amendment to Amendment 1 - Semiconductor devices - Part 1: General, used alongside the parent document IEC 60747-1:2006. It is relevant when teams need to interpret or apply the updated general requirements for semiconductor devices within engineering documentation, product evaluation, and conformity assessment. For procurement, testing, and compliance workflows, IEC 60747-1:2006/AMD1:2010 helps ensure that the latest published changes are tracked against the base document and reflected consistently in technical review activities.
Purpose of IEC 60747-1:2006/AMD1:2010
The purpose of IEC 60747-1:2006/AMD1:2010 is to modify and refine the general framework for semiconductor devices established by the parent reference. As an amendment, it should be read as a connected technical update rather than a standalone engineering specification. Organizations use it to support documented evaluation, maintain operational consistency in design and test references, and confirm that engineering and compliance teams are working from the correct amended source when reviewing device requirements, verification activities, or technical validation records.
Compliance applications of IEC 60747-1:2006/AMD1:2010
This amendment is typically used in quality workflows where semiconductor device documentation, test planning, or procurement review must align with the current published text of the parent standard. It may be relevant for laboratories, manufacturers, and compliance teams preparing technical files, checking conformity assessment evidence, or updating internal references used in product evaluation. IEC 60747-1:2006/AMD1:2010 is especially useful when organizations need to confirm that assessments of semiconductor devices are based on the amended general requirements rather than the unamended edition alone.
Benefits of IEC 60747-1:2006/AMD1:2010
Using IEC 60747-1:2006/AMD1:2010 supports clearer engineering control by keeping the applicable reference set current and traceable. That helps reduce risk in technical assessment, improves consistency in testing workflows, and supports more reliable compliance preparation. For procurement and supplier qualification, it can also clarify which document version should be cited in specifications, purchase documents, and verification records. In practice, this supports quality assurance, conformity assessment preparation, and more defensible review of semiconductor device documentation.
- Amendment connected to the general semiconductor devices framework in IEC 60747-1:2006
- Useful for updating engineering documentation and compliance references to the amended text
- Supports verification activities, documented evaluation, and technical validation workflows
- Relevant for laboratories, manufacturers, and procurement teams managing document control
- Publication Date: 2010-05-19
- Standard Status: Amendment
- Publisher: IEC
- Edition: 2
- This Version: IEC 60747-1:2006 (2010-05-19)
- Previous Version: IEC 60747-1:2006 (2008-08-09)
- Previous Version: IEC 60747-1:2006 (2006-02-21)
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