IEC 60747-1:2006/COR1:2008

IEC 60747-1:2006/COR1:2008 is a corrigendum to Corrigendum 1 - Semiconductor devices - Part 1: General, providing a supporting correction to the parent document IEC 60747-1:2006. For engineers, procurement teams, and compliance reviewers, it is relevant when the underlying technical reference is being used for device selection, verification activities, or documented evaluation. As a modification document rather than a standalone rule set, IEC 60747-1:2006/COR1:2008 helps ensure the parent specification is read and applied with the intended corrections.

IEC 60747-1:2006/COR1:2008 standard overview

This corrigendum belongs to the semiconductor devices series and addresses the general part of the subject area defined in the parent reference. In practice, IEC 60747-1:2006/COR1:2008 is used to support technical review and conformity assessment by clarifying or correcting the original text where needed. That makes it useful in quality workflows, engineering documentation control, and compliance preparation, especially when teams need confidence that product evaluation is based on the corrected form of the source document.

Applications of IEC 60747-1:2006/COR1:2008

Organizations may consult IEC 60747-1:2006/COR1:2008 when maintaining semiconductor-related specifications, reviewing test plans, or checking supplier documentation against the parent standard. It is particularly relevant in environments where device characteristics, verification records, and technical compliance evidence must remain aligned across design, testing, and procurement stages. The corrigendum can also support laboratory evaluation and internal document control when semiconductor device requirements are being interpreted for operational consistency.

Why IEC 60747-1:2006/COR1:2008 matters

Using the corrigendum alongside the parent document helps reduce risk in engineering validation and procurement decisions by ensuring the corrected text is considered during assessment. For compliance teams, that can improve testing consistency, support conformity assessment preparation, and limit errors in technical specifications derived from the original publication. In regulated or quality-driven workflows, even a targeted correction may affect how performance criteria are reviewed and how acceptance evidence is documented.

• Supporting correction linked to IEC 60747-1:2006 for semiconductor devices general requirements
• Useful for controlled document review, specification updates, and technical validation workflows
• Relevant to conformity assessment, supplier evaluation, and compliance reference management
• Helps maintain consistency between engineering documentation and the corrected source text