IEC 61967-6:2002/AMD1:2008
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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About This Item
IEC 61967-6:2002/AMD1:2008 provides a supporting amendment to the technical framework for measuring electromagnetic emissions from integrated circuits, with a specific focus on conducted emissions using the magnetic probe method across the 150 kHz to 1 GHz range. For engineers and compliance teams, it is relevant when documented evaluation of chip-level EMC behavior is needed during product development, laboratory testing, or conformity assessment. As an amendment to IEC 61967-6:2002, it should be used alongside the parent document when reviewing test methods and technical requirements.
What is IEC 61967-6:2002/AMD1:2008?
IEC 61967-6:2002/AMD1:2008 is an amendment connected to the parent document IEC 61967-6:2002, not a standalone testing standard on its own. It modifies or updates the original guidance for measuring conducted electromagnetic emissions from integrated circuits by means of a magnetic probe. In practical terms, it is a technical reference that may support EMC-related engineering review, test planning, and documented evaluation where consistency in emission measurement methods is important.
Applications of IEC 61967-6:2002/AMD1:2008
This amendment is typically relevant in EMC laboratories, electronics development programs, and compliance workflows where integrated circuits are assessed for conducted emissions behavior. It may be used during verification activities, technical validation, and product evaluation for devices that require controlled measurement methods and traceable documentation. Procurement and quality teams may also reference it when confirming that a testing standard aligns with internal risk management, regulatory preparation, and engineering documentation needs for electrical and electronic assemblies.
Why is IEC 61967-6:2002/AMD1:2008 important?
IEC 61967-6:2002/AMD1:2008 matters because amendments can affect how test results are interpreted, compared, or reported against the parent method. For organizations working on technical compliance, it helps support testing consistency, operational consistency, and more reliable conformity assessment preparation. Using the amendment with the base document can reduce ambiguity in laboratory evaluation, strengthen quality workflows, and improve confidence in electromagnetic emissions data used for engineering decisions, supplier review, or compliance documentation.
- Supporting amendment to IEC 61967-6:2002 for conducted emissions measurement using a magnetic probe method
- Relevant to EMC test planning, laboratory evaluation, and documented measurement procedures
- Useful for technical review of integrated circuits within emissions-focused compliance workflows
- Helps align engineering documentation and conformity assessment activities with the parent document
- Publication Date: 2008-12-03
- Standard Status: Amendment
- Publisher: IEC
- Edition: 1
- New Version Available: IEC 61967-6:2002 (2010-08-30)
- This Version: IEC 61967-6:2002 (2008-12-03)
- Previous Version: IEC 61967-6:2002 (2002-06-25)
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